Table of contents
About this book
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Analog Circuits and Signal Processing Built-in-Self-Calibration Built-in-Self-Test Embedded Systems LTE 4G Low Noise Amplifiers Nanometer Wireless Radio RF and Millimeter Wave Integrated Circuits Testing Integrated Circuits WIMAX