Built-in-Self-Test and Digital Self-Calibration for RF SoCs

  • Sleiman Bou-Sleiman
  • Mohammed Ismail

Part of the SpringerBriefs in Electrical and Computer Engineering book series (BRIEFSELECTRIC)

Table of contents

  1. Front Matter
    Pages i-xvii
  2. Sleiman Bou-Sleiman, Mohammed Ismail
    Pages 1-12
  3. Sleiman Bou-Sleiman, Mohammed Ismail
    Pages 13-34
  4. Sleiman Bou-Sleiman, Mohammed Ismail
    Pages 35-55
  5. Sleiman Bou-Sleiman, Mohammed Ismail
    Pages 57-71
  6. Sleiman Bou-Sleiman, Mohammed Ismail
    Pages 73-86
  7. Sleiman Bou-Sleiman, Mohammed Ismail
    Pages 87-89

About this book

Introduction

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 

Keywords

Analog Circuits and Signal Processing Built-in-Self-Calibration Built-in-Self-Test Embedded Systems LTE 4G Low Noise Amplifiers Nanometer Wireless Radio RF and Millimeter Wave Integrated Circuits Testing Integrated Circuits WIMAX

Authors and affiliations

  • Sleiman Bou-Sleiman
    • 1
  • Mohammed Ismail
    • 2
  1. 1.The Ohio State UniversityColumbusUSA
  2. 2., Dpt. of Electrical & Computer EngineerinThe Ohio State UniversityColumbusUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-9548-3
  • Copyright Information Springer Science+Business Media, LLC 2012
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4419-9547-6
  • Online ISBN 978-1-4419-9548-3
  • About this book