Nanoscale Memory Repair

  • Masashi Horiguchi
  • Kiyoo Itoh

Part of the Integrated Circuits and Systems book series (ICIR)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Masashi Horiguchi, Kiyoo Itoh
    Pages 1-17
  3. Masashi Horiguchi, Kiyoo Itoh
    Pages 19-67
  4. Masashi Horiguchi, Kiyoo Itoh
    Pages 69-137
  5. Masashi Horiguchi, Kiyoo Itoh
    Pages 139-155
  6. Masashi Horiguchi, Kiyoo Itoh
    Pages 157-201
  7. Masashi Horiguchi, Kiyoo Itoh
    Pages 203-212
  8. Back Matter
    Pages 213-215

About this book

Introduction

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully.

This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. 

  • Presents the first comprehensive reference to reliability and repair techniques for nano-scale memories;
  • Covers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memories;
  • Includes a variety of practical circuits and logic, critical for higher yield and reliability, which have been proven successful during the authors’ extensive experience in developing memories and low-voltage CMOS circuits.
     
     


Keywords

Embedded Systems Integrated Circuit Design Memory Reliability and Repair Nanoscale Memory Soft Errors

Authors and affiliations

  • Masashi Horiguchi
    • 1
  • Kiyoo Itoh
    • 2
  1. 1.Renesas Electronics CorporationKodaira-shi, TokyoJapan
  2. 2.Central Research LaboratoryHitachi Ltd.Kokubunji-shi, TokyoJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-7958-2
  • Copyright Information Springer Science+Business Media, LLC 2011
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4419-7957-5
  • Online ISBN 978-1-4419-7958-2
  • Series Print ISSN 1558-9412
  • About this book