Scanning Transmission Electron Microscopy

Imaging and Analysis

  • Stephen J. Pennycook
  • Peter D. Nellist

Table of contents

  1. Front Matter
    Pages i-xii
  2. Stephen J. Pennycook
    Pages 1-90
  3. Peter D. Nellist
    Pages 91-115
  4. Andrew R. Lupini
    Pages 117-161
  5. Mathieu Kociak, Odile Stéphan, Michael G. Walls, Marcel Tencé, Christian Colliex
    Pages 163-205
  6. Guillaume Radtke, Gianluigi A. Botton
    Pages 207-245
  7. Leslie J. Allen, Scott D. Findlay, Mark P. Oxley
    Pages 247-289
  8. Paul A. Midgley, Matthew Weyland
    Pages 353-392
  9. Jian -Min Zuo, Jing Tao
    Pages 393-427
  10. Maria Varela, Jaume Gazquez, Timothy J. Pennycook, Cesar Magen, Mark P. Oxley, Stephen J. Pennycook
    Pages 429-466
  11. Yuichi Ikuhara, Naoya Shibata
    Pages 467-521
  12. James M. LeBeau, Dmitri O. Klenov, Susanne Stemmer
    Pages 523-536
  13. Eiji Abe
    Pages 583-614
  14. Ondrej L. Krivanek, Matthew F. Chisholm, Niklas Dellby, Matthew F. Murfitt
    Pages 615-658
  15. Nigel D. Browning, Ilke Arslan, Rolf Erni, Bryan W. Reed
    Pages 659-688
  16. Robert F. Klie, Weronika Walkosz, Guang Yang, Yuan Zhao
    Pages 689-723
  17. Paul M. Voyles, Stephanie Bogle, John R. Abelson
    Pages 725-756
  18. Back Matter
    Pages 757-762

About this book


Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.



Editors and affiliations

  • Stephen J. Pennycook
    • 1
  • Peter D. Nellist
    • 2
  1. 1.Oak Ridge National LaboratoryOak RidgeUSA
  2. 2., Department of MaterialsUniversity of OxfordOxfordUnited Kingdom

Bibliographic information