© 2011

Scanning Probe Microscopy of Functional Materials

Nanoscale Imaging and Spectroscopy

  • Sergei V. Kalinin
  • Alexei Gruverman

Table of contents

  1. Front Matter
    Pages i-xviii
  2. Spectroscopic SPM at the Resolution Limits

  3. Dynamic Spectroscopic SPM

  4. Thermal Characterization by SPM

  5. Electrical and Electromechanical SPM

    1. Front Matter
      Pages 231-231
    2. V. V. Shvartsman, W. Kleemann, D. A. Kiselev, I. K. Bdikin, A. L. Kholkin
      Pages 345-383
    3. Andreas Ruediger
      Pages 385-402
  6. Novel SPM concepts

    1. Front Matter
      Pages 403-403
    2. Volker Rose, John W. Freeland, Stephen K. Streiffer
      Pages 405-431

About this book


Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization


Functional Materials Nanoscale Characterization Scanning Probe Microscopy

Editors and affiliations

  • Sergei V. Kalinin
    • 1
  • Alexei Gruverman
    • 2
  1. 1., NanoTransport LaboratoryOak Ridge National LaboratoryOak RidgeUSA
  2. 2.Dept. Materials Science and Engineering, Department of Physics & AstronomyUniversity of Nebraska - LincolnLincolnUSA

About the editors

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

Bibliographic information