© 2011

Soft Errors in Modern Electronic Systems

  • Michael Nicolaidis

Part of the Frontiers in Electronic Testing book series (FRET, volume 41)

Table of contents

  1. Front Matter
    Pages i-xviii
  2. Nadine Buard, Lorena Anghel
    Pages 77-102
  3. Luis Entrena, Celia López-Ongil, Mario García-Valderas, Marta Portela-García, Michael Nicolaidis
    Pages 141-166
  4. Michael Nicolaidis
    Pages 203-252
  5. Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
    Pages 253-285
  6. Allan L. Silburt, Adrian Evans, Ana Burghelea, Shi-Jie Wen, David Ward, Ron Norrish et al.
    Pages 287-311
  7. Back Matter
    Pages 313-316

About this book


Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.

Editors and affiliations

  • Michael Nicolaidis
    • 1
  1. 1.Grenoble INP, CNRS, UJFTIMA LaboratoryGrenoble CXFrance

Bibliographic information