Advertisement

Extreme Statistics in Nanoscale Memory Design

  • Amith Singhee
  • Rob A. Rutenbar

Part of the Integrated Circuits and Systems book series (ICIR)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Amith Singhee
    Pages 1-8
  3. Amith Singhee
    Pages 9-15
  4. Chenjie Gu, Jaijeet Roychowdhury
    Pages 137-177
  5. Xiaoping Du, Wei Chen, Yu Wang
    Pages 179-202
  6. Robert C. Aitken, Amith Singhee, Rob A. Rutenbar
    Pages 203-240
  7. Back Matter
    Pages 241-246

About this book

Introduction

Extreme Statistics in Nanoscale Memory Design brings together some of the world’s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme statistics in nanoscale memories. The work covers a variety of techniques, including statistical, deterministic, model-based and non-parametric methods, along with relevant description of the sources of variations and their impact on devices and memory design. Specifically, the authors cover methods from extreme value theory, Monte Carlo simulation, reliability modeling, direct memory margin computation and hypervolume computation. Ideas are also presented both from the perspective of an EDA practitioner and a memory designer to provide a comprehensive understanding of the state-of -the-art in the area of extreme statistics estimation and statistical memory design. Extreme Statistics in Nanoscale Memory Design is a useful reference on statistical design of integrated circuits for researchers, engineers and professionals.

Keywords

CMOS Device Variability Modeling EVT Extreme Value Theory Memory Design Nanoscale VLSI Sampling-Based Estimation VLSI design automation electronic design automation integrated circuit material

Editors and affiliations

  • Amith Singhee
    • 1
  • Rob A. Rutenbar
    • 2
  1. 1.T.J. Watson Research CenterIBM CorporationYorktown HeightsUSA
  2. 2.Department of Computer ScienceUniversity of Illinois at Urbana-ChampaiUrbanaUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-6606-3
  • Copyright Information Springer Science+Business Media, LLC 2010
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-1-4419-6605-6
  • Online ISBN 978-1-4419-6606-3
  • Series Print ISSN 1558-9412
  • Buy this book on publisher's site