© 2010

Advanced Computing in Electron Microscopy


Table of contents

  1. Front Matter
    Pages i-x
  2. Earl J. Kirkland
    Pages 1-4
  3. Earl J. Kirkland
    Pages 5-27
  4. Earl J. Kirkland
    Pages 29-60
  5. Earl J. Kirkland
    Pages 61-76
  6. Earl J. Kirkland
    Pages 77-113
  7. Earl J. Kirkland
    Pages 163-197
  8. Earl J. Kirkland
    Pages 199-231
  9. Earl J. Kirkland
    Pages 233-240
  10. Earl J. Kirkland
    Pages 241-242
  11. Earl J. Kirkland
    Pages 243-260
  12. Earl J. Kirkland
    Pages 261-263
  13. Earl J. Kirkland
    Pages 265-269
  14. Back Matter
    Pages 287-289

About this book


Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field.

This enhanced second edition includes:

-descriptions of new developments in the field

-updated references

-additional material on aberration corrected instruments and confocal electron microscopy

-expanded and improved examples and sections to provide stronger clarity


computer simulation electron microscopy fast fourier projection theorem fast fourier transform multislice methods scanning transmission electron microscope theory of electron image formation transmission electron microscopy

Authors and affiliations

  1. 1.School of Applied and Engineering PhysicCornell UniversityIthacaUSA

Bibliographic information


From the reviews of the second edition:

“It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. … the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked.” (Ultramicroscopy, Vol. 116, 2012)