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Reliability Physics and Engineering

Time-To-Failure Modeling

  • J.W. McPherson

Table of contents

  1. Front Matter
    Pages i-xiii
  2. J.W. McPherson
    Pages 1-3
  3. J.W. McPherson
    Pages 5-28
  4. J.W. McPherson
    Pages 37-50
  5. J.W. McPherson
    Pages 51-61
  6. J.W. McPherson
    Pages 63-77
  7. J.W. McPherson
    Pages 79-93
  8. J.W. McPherson
    Pages 95-107
  9. J.W. McPherson
    Pages 109-119
  10. J.W. McPherson
    Pages 121-136
  11. J.W. McPherson
    Pages 310-311
  12. Back Matter
    Pages 311-318

About this book

Introduction

Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: • Materials/Device Degradation • Degradation Kinetics • Time-To-Failure Modeling • Statistical Tools • Failure-Rate Modeling • Accelerated Testing • Ramp-To-Failure Testing • Important Failure Mechanisms for Integrated Circuits • Important Failure Mechanisms for Mechanical Components • Conversion of Dynamical Stresses into Static Equivalents • Small Design Changes Producing Major Reliability Improvements This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter. Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists.

Keywords

Burnin and Defect Elimination Failure Rate Reduction Time-To Time-To-Failure Modeling design development electrical engineering integrated circuit materials materials science mechanical engineering modeling reliability reliability engineering

Authors and affiliations

  • J.W. McPherson
    • 1
  1. 1.IEEE FellowPlanoUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-6348-2
  • Copyright Information Springer Science+Business Media, LLC 2010
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-1-4419-6347-5
  • Online ISBN 978-1-4419-6348-2
  • Buy this book on publisher's site