Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

  • Alberto Bosio
  • Luigi Dilillo
  • Patrick Girard
  • Serge Pravossoudovitch
  • Arnaud Virazel

Table of contents

  1. Front Matter
    Pages i-xv
  2. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 1-19
  3. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 21-48
  4. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 49-64
  5. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 65-80
  6. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 81-97
  7. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 99-114
  8. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 115-132
  9. Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
    Pages 133-158
  10. Back Matter
    Pages 159-171

About this book

Introduction

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by:

Alberto Bosio

Luigi Dilillo

Patrick Girard

Serge Pravossoudovitch

Arnaud Virazel

Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.

  • First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
  • Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
  • Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
  • Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.

Keywords

Dynamic Memory Faults Electronic Testing Memory Testing Nanoscale Testing SRAM Semiconductor Memories Semiconductor Testing Technologie currmssc design diagnosis electronics semiconductor technology testing

Authors and affiliations

  • Alberto Bosio
    • 1
  • Luigi Dilillo
    • 2
  • Patrick Girard
    • 3
  • Serge Pravossoudovitch
    • 4
  • Arnaud Virazel
    • 5
  1. 1.de Robotique de Microélectronique deLIRMM - Laboratoire d'InformatiqueMontpellierFrance
  2. 2.de Robotique de Microélectronique deLIRMM - Laboratoire d'InformatiqueMontpellierFrance
  3. 3.de Robotique de Microélectronique deLIRMM - Laboratoire d'InformatiqueMontpellierFrance
  4. 4.de Robotique de Microélectronique deLIRMM - Laboratoire d'InformatiqueMontpellierFrance
  5. 5.de Robotique de Microélectronique deLIRMM - Laboratoire d'InformatiqueMontpellierFrance

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-0938-1
  • Copyright Information Springer-Verlag US 2010
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-1-4419-0937-4
  • Online ISBN 978-1-4419-0938-1
  • About this book