Particle Size Measurements

Fundamentals, Practice, Quality

  • Henk G. Merkus

Part of the Particle Technology Series book series (POTS, volume 17)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Henk G. Merkus
    Pages 1-11
  3. Henk G. Merkus
    Pages 13-42
  4. Henk G. Merkus
    Pages 43-72
  5. Henk G. Merkus
    Pages 73-116
  6. Henk G. Merkus
    Pages 117-136
  7. Henk G. Merkus
    Pages 137-194
  8. Henk G. Merkus
    Pages 195-217
  9. Henk G. Merkus
    Pages 219-240
  10. Henk G. Merkus
    Pages 241-257
  11. Henk G. Merkus
    Pages 259-285
  12. Henk G. Merkus
    Pages 287-298
  13. Henk G. Merkus
    Pages 299-317
  14. Henk G. Merkus
    Pages 319-348
  15. Henk G. Merkus
    Pages 349-364
  16. Henk G. Merkus
    Pages 365-376
  17. Henk G. Merkus
    Pages 377-402
  18. Henk G. Merkus
    Pages 403-410
  19. Henk G. Merkus
    Pages 411-435
  20. Henk G. Merkus
    Pages 437-467

About this book

Introduction

Following my graduation in physical organic chemistry at the University of Amst- dam, I started to work at the Royal Dutch Shell Laboratories in Amsterdam. My first assignment was research in the field of detergents and industrial chemicals. It was followed by development work on thermal wax cracking for production of C – C 2 14 olefins and on acid-catalyzed synthesis of carboxylic acids from C – C olefins. 3 6 Then, I made a significant change to analytical chemistry, first at Shell’s process development department and later in the chemical engineering department of Delft University of Technology. In both departments, there was a large variety of analy- cal techniques and development of new methods for automated analysis of small process streams. It was the time that gas chromatography conquered the world. In this field, a firm basis was given by Henk Boer, Arie Kwantes and Frits Zuiderweg at Shell Research Laboratories in Amsterdam, both for packed and for capillary c- umns. The potential of gas chromatography was huge and, therefore, also in Delft, its use increased enormously. Moreover, the growth of this technique was facilitated significantly by the rapidly developing electronics industry. It not only led to digital peak integrators and personal computers but also enabled complex measurement techniques. In addition, I became involved in surface area and porosity characteri- tion of catalysts and adsorbents, on which topic the research had been initiated by Prof. J. H. de Boer.

Keywords

Gravitation calibration diffraction laser diffraction liquid materials measurement microscopy particulate analysis quality sedimentation sieving ultrasound ultrasound extinction

Authors and affiliations

  • Henk G. Merkus
    • 1
  1. 1.Delft University of TechnologyCZ PijnackerThe Netherlands

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4020-9016-5
  • Copyright Information Springer Netherlands 2009
  • Publisher Name Springer, Dordrecht
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-1-4020-9015-8
  • Online ISBN 978-1-4020-9016-5
  • Series Print ISSN 1567-827X
  • About this book