Table of contents

  1. Front Matter
    Pages i-xiv
  2. Section 1

    1. Front Matter
      Pages 1-1
    2. Alan F. Murray, H. Martin Reekie
      Pages 3-13
    3. Alan F. Murray, H. Martin Reekie
      Pages 14-42
    4. Alan F. Murray, H. Martin Reekie
      Pages 43-62
    5. Alan F. Murray, H. Martin Reekie
      Pages 63-74
    6. Alan F. Murray, H. Martin Reekie
      Pages 75-85
    7. Alan F. Murray, H. Martin Reekie
      Pages 86-99
    8. Alan F. Murray, H. Martin Reekie
      Pages 100-116
  3. Section II

    1. Front Matter
      Pages 117-117
    2. Alan F. Murray, H. Martin Reekie
      Pages 119-145
  4. Back Matter
    Pages 146-152

About this book

Keywords

bipolar junction transistor circuit CMOS design automation electronic circuit field-effect transistor Gate Array integrated circuit Leistungsfeldeffekttransistor material physics semiconductor system on chip (SoC) testing transistor

Authors and affiliations

  • Alan F. Murray
    • 1
  • H. Martin Reekie
    • 1
  1. 1.Department of Electrical EngineeringEdinburgh UniversityUK

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-349-18758-4
  • Copyright Information Macmillan Publishers Limited 1987
  • Publisher Name Palgrave, London
  • eBook Packages Engineering
  • Print ISBN 978-0-333-43799-5
  • Online ISBN 978-1-349-18758-4
  • About this book