Advertisement

Parametric and Semiparametric Models with Applications to Reliability, Survival Analysis, and Quality of Life

  • N. Balakrishnan
  • M. S. Nikulin
  • M. Mesbah
  • N. Limnios

Part of the Statistics for Industry and Technology book series (SIT)

Table of contents

  1. Front Matter
    Pages i-xli
  2. Cox Models and Analyses

  3. Degradation Models and Analyses

  4. Accelerated Failure Time Models and Analyses

  5. Aging Properties and Analyses

    1. Front Matter
      Pages 133-133
  6. Analyses of Censored and Truncated Data

    1. Front Matter
      Pages 165-165
    2. N. Balakrishnan, J.-A. Kim
      Pages 177-210
  7. Regression Methods And Applications

  8. Time Series Analysis

    1. Front Matter
      Pages 251-251
    2. Priscilla E. Greenwood, Ursula U. Müller, Wolfgang Wefelmeyer
      Pages 253-269
  9. Inferential Analysis

    1. Front Matter
      Pages 271-271
    2. Carles M. Cuadras, Josep Fortiana
      Pages 273-290
    3. Hannelore Liero
      Pages 307-330
  10. Multicentre Studies

    1. Front Matter
      Pages 331-331
    2. Vladimir V. Anisimov, Valerii V. Fedorov
      Pages 333-345
  11. Quality of Life Studies

    1. Front Matter
      Pages 347-347
    2. Mohand-Larbi Feddag, Mounir Mesbah
      Pages 363-382
  12. Breast Cancer Studies

    1. Front Matter
      Pages 383-383
    2. Thu M. Hoàng, Van L. Parsons
      Pages 385-398
    3. Kenneth M. Boucher, Bernard Asselain, Alexander D. Tsodikov, Andrei Y. Yakovlev
      Pages 399-415
  13. Inference for Processes

  14. Probability Theory and Applications

  15. Back Matter
    Pages 553-555

About this book

Introduction

Parametric and semiparametric models are tools with a wide range of applications to reliability, survival analysis, and quality of life. This self-contained volume examines these tools in survey articles written by experts currently working on the development and evaluation of models and methods. While a number of chapters deal with general theory, several explore more specific connections and recent results in "real-world" reliability theory, survival analysis, and related fields.

Keywords

Censoring Estimator Likelihood Markov process Poisson process Probability theory Regression analysis STATISTICA Survival analysis Time series Truncated Data best fit diffusion process expectation–maximization algorithm statistics

Editors and affiliations

  • N. Balakrishnan
    • 1
  • M. S. Nikulin
    • 2
    • 3
  • M. Mesbah
    • 4
  • N. Limnios
    • 5
  1. 1.Department of Mathematics and StatisticsMcMaster UniversityHamiltonCanada
  2. 2.Laboratoire Statistique MathématiqueUniversité Bordeaux 2Bordeaux CedexFrance
  3. 3.Laboratory of Statistical MethodsV. Steklov Mathematical InstituteSt. PetersburgRussia
  4. 4.UFR SSIUniversité de Bretagne-SudVannes CedexFrance
  5. 5.Division Mathématiques AppliquéesUniversité de Technologie de CompiègneCompiègne CedexFrance

Bibliographic information

  • DOI https://doi.org/10.1007/978-0-8176-8206-4
  • Copyright Information Springer Science+Business Media New York 2004
  • Publisher Name Birkhäuser, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4612-6491-0
  • Online ISBN 978-0-8176-8206-4
  • Series Print ISSN 2364-6241
  • Series Online ISSN 2364-625X
  • Buy this book on publisher's site