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Scanning Probe Microscopy

Electrical and Electromechanical Phenomena at the Nanoscale

  • Sergei Kalinin
  • Alexei Gruverman

Table of contents

  1. Front Matter
    Pages i-xx
  2. Introduction

    1. S. V. Kalinin, A. Gruverman
      Pages 1-8
  3. SPM Techniques for Electrical Characterization

    1. Front Matter
      Pages 9-9
    2. P. Eyben, W. Vandervorst, D. Alvarez, M. Xu, M. Fouchier
      Pages 31-87
    3. Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks
      Pages 113-131
    4. Ryan O’Hayre, Minhwan Lee, Fritz B. Prinz, Sergei V. Kalinin
      Pages 132-172
    5. A. L. Kholkin, S. V. Kalinin, A. Roelofs, A. Gruverman
      Pages 173-214
    6. Steven M. Anlage, Vladimir V. Talanov, Andrew R. Schwartz
      Pages 215-253
    7. Alexandre Bouhelier, Renaud Bachelot
      Pages 254-279
    8. T. J. Smith, K. J. Stevenson
      Pages 280-314
    9. C. A. Paulson, D. W. Van Der Weide
      Pages 315-345
  4. Electrical and Electromechanical Imaging at the Limits of Resolution

    1. Front Matter
      Pages 347-347
    2. Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner
      Pages 372-394
    3. Kevin F. Kelly, Paul S. Weiss
      Pages 395-422
    4. C. Staii, M. Radosavljevic, A. T. Johnson Jr
      Pages 423-439
    5. Vincent Meunier, Philippe Lambin
      Pages 455-479
    6. Shuji Hasegawa
      Pages 480-505
    7. Udo D. Schwarz, Hendrik Hölscher
      Pages 506-533
    8. Christoph Renner, Henrik M. Rønnow
      Pages 534-558
  5. Electrical SPM Characterization of Materials and Devices

    1. Front Matter
      Pages 559-559
    2. Scott B. Kuntze, Dayan Ban, Edward H. Sargent, St. John Dixon-Warren, J. Kenton White, Karin Hinzer
      Pages 561-600
    3. Alexei Gruverman, Brian J. Rodriguez, Sergei V. Kalinin
      Pages 615-633
    4. C. Y. Nakakura, P. Tangyunyong, M. L. Anderson
      Pages 634-662
    5. Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner
      Pages 663-689
    6. Sidney R. Cohen
      Pages 715-745
    7. K. Szot, B. Reichenberg, F. Peter, R. Waser, S. Tiedke
      Pages 746-775
    8. Takao Ishida, Wataru Mizutani, Yasuhisa Naitoh, Hiroshi Tokumoto
      Pages 776-787
    9. William R. Silveira, Erik M. Muller, Tse Nga Ng, David Dunlap, John A. Marohn
      Pages 788-830
  6. Electrical Nanofabrication

    1. Front Matter
      Pages 831-831
    2. Nicola Naujoks, Patrick Mesquida, Andreas Stemmer
      Pages 833-857
    3. Peter M. Albrecht, Laura B. Ruppalt, Joseph W. Lyding
      Pages 880-905
    4. Dongbo Li, Dawn A. Bonnell
      Pages 906-928
    5. James A. Williams, Matthew S. Lewis, Christopher B. Gorman
      Pages 929-942
    6. Seungbum Hong, Noyeol Park
      Pages 943-973
  7. Back Matter
    Pages 974-980

About this book

Introduction

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Keywords

AFM KLTcatalog Microscopy Nanotube PED Polymer REM STEM STM carbon nanotubes electronics mechanics polymers spectroscopy ultrasound

Editors and affiliations

  • Sergei Kalinin
    • 1
  • Alexei Gruverman
    • 2
  1. 1.Oak Ridge National LaboratoryOak RidgeUSA
  2. 2.Dept. Materials Science and EngineeringNorth Carolina State UniversityRaleighUSA

Bibliographic information