Table of contents

  1. Front Matter
  2. Mark Aagaard, Miriam Leeser
    Pages 13-32
  3. Phillip J. Windley, Michael L. Coe
    Pages 33-51
  4. John O'Leary, Miriam Leeser, Jason Hickey, Mark Aagaard
    Pages 52-71
  5. C. A. J. van Eijk, G. L. J. M. Janssen
    Pages 110-125
  6. Steven D. Johnson, Paul S. Miner, Albert Camilleri
    Pages 126-145
  7. Michael Kishinevsky, Jørgen Staunstrup
    Pages 146-164
  8. Junji Kitamichi, Sumio Morioka, Teruo Higashino, Kenichi Taniguchi
    Pages 165-184
  9. Niels Maxetti
    Pages 185-202
  10. D. Cyrluk, S. Rajan, N. Shankar, M. K. Srivas
    Pages 203-222
  11. Thomas Kropf, Klaus Schneider, Ramayya Kumar
    Pages 223-238
  12. Niels Mellergaard, Jørgen Staunstrup
    Pages 239-257
  13. S. Owre, J. M. Rushby, N. Shankar, M. K. Srivas
    Pages 258-279
  14. Holger Busch
    Pages 280-285
  15. G. Bezzi, M. Bombana, P. Cavalloro, S. Conigliaro, G. Zaza
    Pages 286-291
  16. Michel Allemand
    Pages 292-297
  17. Back Matter

About these proceedings


This volume presents the proceedings of the Second International Conference on Theorem Provers in Circuit Design (TPCD '94) jointly organized by the Forschungszentrum Informatik (University of Karlsruhe) and IFIP Working Group 10.2 in Bad Herrenalb, Germany in September 1994.
The 19 papers included are thoroughly revised versions of the submissions selected for presentation at the conference and address all current aspects of theorem provers in circuit design. Particular emphasis is given to benchmark-circuits for hardware verification; tutorials on two popular theorem provers are included.


Hardware circuit design computer science hardware verification integrated circuit static-induction transistor verification

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1995
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-59047-7
  • Online ISBN 978-3-540-49177-4
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349
  • Buy this book on publisher's site