Advertisement

Nanoscale Spectroscopy and Its Applications to Semiconductor Research

  • Yoshio Watanabe
  • Giancarlo Salviati
  • Stefan Heun
  • Naoki Yamamoto

Part of the Lecture Notes in Physics book series (LNP, volume 588)

Table of contents

  1. Front Matter
    Pages I-XI
  2. S. Heun, G. Salviati, Y. Watanabe, N. Yamamoto
    Pages 1-7
  3. K. Yagi, Y. Tanishiro, H. Minoda
    Pages 11-23
  4. M. Ivanda, A. M. Tonejc, I. Djerdj, M. Gotić, S. Musić, G. Mariotto et al.
    Pages 24-36
  5. O. Martínez, M. Avella, A. M. Ardila, J. Jiménez, B. Gerad, E. G. Lafon
    Pages 74-81
  6. A. Armigliato, R. Balboni, S. Frabboni, A. Benedetti, A. G. Cullis
    Pages 82-90
  7. K. C. Prince, S. Heun, L. Gregoratti, A. Barinov, M. Kiskinova
    Pages 111-120
  8. F. Barbo, M. Bertolo, A. Bianco, G. Cautero, R. Cimino, S. Fontana et al.
    Pages 121-130
  9. N. Ueno, H. Yasufuku, S. Kera, K. K. Okudaira, Y. Harada
    Pages 131-144
  10. R. Vašina, M. Mynář, V. Kolařík
    Pages 172-179
  11. M. Colocci, V. Emiliani, P. G. Gucciardi, J. Kudrna, A. Vinattieri
    Pages 199-209
  12. A. Crottini, J. L. Staehli, B. Deveaud, X. L. Wang, M. Ogura
    Pages 210-221
  13. H. Iwasaki, T. Ito, M. Gotoh, L. Nan, K. Sudoh
    Pages 231-240
  14. T. K. Johal, R. Rinaldi, A. Passaseo, R. Cingolani, A. Vasanelli, R. Ferreira et al.
    Pages 241-251
  15. F. Rosei, N. Motta, A. Sgarlata, A. Balzarotti
    Pages 252-262
  16. K. Kanisawa, M. J. Butcher, Y. Tokura, H. Yamaguchi, Y. Hirayama
    Pages 263-268
  17. Back Matter
    Pages 305-306

About these proceedings

Introduction

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher,taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.

Keywords

Transit electron microscope electron microscopy nanostructure optics quantum dot sensor spectroscopy temperature

Editors and affiliations

  • Yoshio Watanabe
    • 1
  • Giancarlo Salviati
    • 2
  • Stefan Heun
    • 3
  • Naoki Yamamoto
    • 4
  1. 1.NTT Basic Research LaboratoriesAtsugi-shi KanagawaJapan
  2. 2.Istituto MASPECParmaItaly
  3. 3.Sincrotrone TriesteTriesteItaly
  4. 4.Tokyo Institute of TechnologyTokyoJapan

Bibliographic information

  • DOI https://doi.org/10.1007/3-540-45850-6
  • Copyright Information Springer-Verlag Berlin Heidelberg 2002
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-43312-5
  • Online ISBN 978-3-540-45850-0
  • Series Print ISSN 0075-8450
  • Buy this book on publisher's site