Yeast Stress Responses

  • Stefan Hohmann
  • Willem H. Mager

Part of the Topics in Current Genetics book series (TCG, volume 1)

Table of contents

  1. Front Matter
    Pages I-XIII
  2. Stefan Hohmann, Willem H. Mager
    Pages 1-9
  3. Amy Trott, Kevin A. Morano
    Pages 71-119
  4. Markus J. Tamás, Stefan Hohmann
    Pages 121-200
  5. Ingrid Wadskog, Lennart Adler
    Pages 201-239
  6. Michel B. Toledano, Agnes Delaunay, Benoit Biteau, Daniel Spector, Dulce Azevedo
    Pages 241-303
  7. Joris Winderickx, Inge Holsbeeks, Ole Lagatie, Frank Giots, Johan Thevelein, Han de Winde
    Pages 305-386
  8. Back Matter
    Pages 387-389

About this book


Every cell has developed mechanisms to respond to changes in its environment and to adapt its growth and metabolism to unfavorable conditions. The unicellular eukaryote yeast has long proven as a particularly useful model system for the analysis of cellular stress responses, and the completion of the yeast genome sequence has only added to its power
This volume comprehensively reviews both the basic features of the yeast genral stress response and the specific adapations to different stress types (nutrient depletion, osmotic and heat shock as well as salt and oxidative stress). It includes the latest findings in the field and discusses the implications for the analysis of stress response mechanisms in higher eukaryotes as well.


eukaryota eukaryote genomics saccharomyces cerevisiae signal transduction stress yeast

Editors and affiliations

  • Stefan Hohmann
    • 1
  • Willem H. Mager
    • 2
  1. 1.Department of Cell and Molecular Biology/MicrobiologyGöteborg UniversityGöteborgSweden
  2. 2.Department of Biochemistry & Molecular Biology Division of ScheikundeVrije UniversiteitAmsterdamThe Netherlands

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2003
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-43926-4
  • Online ISBN 978-3-540-45611-7
  • Series Print ISSN 1610-2096
  • Buy this book on publisher's site