Static Analysis

13th International Symposium, SAS 2006, Seoul, Korea, August 29-31, 2006. Proceedings

  • Kwangkeun Yi
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4134)

Table of contents

  1. Front Matter
  2. Invited Talk

  3. Session 1

    1. Sriram Sankaranarayanan, Franjo Ivančić, Ilya Shlyakhter, Aarti Gupta
      Pages 3-17
    2. Eric Goubault, Sylvie Putot
      Pages 18-34
    3. Xavier Allamigeon, Wenceslas Godard, Charles Hymans
      Pages 35-51
  4. Session 2

    1. Ahmed Bouajjani, Peter Habermehl, Adam Rogalewicz, Tomáš Vojnar
      Pages 52-70
    2. Ranjit Jhala, Rupak Majumdar, Ru-Gang Xu
      Pages 71-87
    3. Polyvios Pratikakis, Jeffrey S. Foster, Michael Hicks
      Pages 88-106
  5. Session 3

    1. Germán Puebla, Elvira Albert, Manuel Hermenegildo
      Pages 107-126
    2. David A. Schmidt
      Pages 127-143
    3. Laure Gonnord, Nicolas Halbwachs
      Pages 144-160
    4. Pierre Amiranoff, Albert Cohen, Paul Feautrier
      Pages 161-180
  6. Invited Talk

    1. Peter W. O’Hearn
      Pages 181-181
    2. Cristiano Calcagno, Dino Distefano, Peter W. O’Hearn, Hongseok Yang
      Pages 182-203
  7. Session 4

    1. Gogul Balakrishnan, Thomas Reps
      Pages 221-239
    2. Alexey Gotsman, Josh Berdine, Byron Cook
      Pages 240-260
    3. Alexey Loginov, Thomas Reps, Mooly Sagiv
      Pages 261-279
  8. Invited Talk

    1. Hongseok Yang
      Pages 280-280
  9. Session 5

    1. Yuqiang Huang, Bruce R. Childers, Mary Lou Soffa
      Pages 281-300

About these proceedings

Keywords

algorithm algorithms compiler data structure data structures logic optimization verification

Editors and affiliations

  • Kwangkeun Yi
    • 1
  1. 1.Seoul National UniversityKorea

Bibliographic information

  • DOI https://doi.org/10.1007/11823230
  • Copyright Information Springer-Verlag Berlin Heidelberg 2006
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science
  • Print ISBN 978-3-540-37756-6
  • Online ISBN 978-3-540-37758-0
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349