© 2007

Applied Scanning Probe Methods VII

Biomimetics and Industrial Applications

  • Bharat Bhushan
  • Harald Fuchs

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages I-XLV
  2. Michael Nosonovsky, Bharat Bhushan
    Pages 1-40
  3. Bharat Bhushan, Robert A. Sayer
    Pages 41-76
  4. Horacio D. Espinosa, Nicolaie Moldovan, K.-H. Kim
    Pages 77-134
  5. Horacio D. Espinosa, Changhong Ke
    Pages 135-196
  6. Jeppe Vang Lauritsen, Ronny T. Vang, Flemming Besenbacher
    Pages 197-224
  7. Claude Martelet, Nicole Jaffrezic-Renault, Yanxia Hou, Abdelhamid Errachid, François Bessueille
    Pages 225-257
  8. Gunther Wittstock, Malte Burchardt, Sascha E. Pust
    Pages 259-299
  9. Bharat Bhushan, Huiwen Liu
    Pages 349-366
  10. Back Matter
    Pages 367-380

About this book


The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.


AFM Biosensor Material Science Microscopy Nanoscience Physical Chemistry Polymer STEM Surface Science biomimetics ceramics modeling

Editors and affiliations

  • Bharat Bhushan
    • 1
  • Harald Fuchs
    • 2
  1. 1.Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott LaboratoryThe Ohio State UniversityColumbusUSA
  2. 2.Center for Nanotechnology (CeNTech) and Institute of PhysicsUniversity of MünsterMünsterGermany

Bibliographic information