Book 2006

Integrated Circuit Test Engineering

Modern Techniques

Authors:

ISBN: 978-1-84628-023-8 (Print) 978-1-84628-173-0 (Online)

Table of contents (12 chapters)

  1. Front Matter

    Pages i-xxx

  2. No Access

    Chapter

    Pages 1-16

    Introduction to Integrated Circuit Test Engineering

  3. No Access

    Chapter

    Pages 17-39

    Fabrication Processes for Integrated Circuits

  4. No Access

    Chapter

    Pages 41-93

    Digital Logic Test

  5. No Access

    Chapter

    Pages 95-121

    Memory Test

  6. No Access

    Chapter

    Pages 123-142

    Analogue Test

  7. No Access

    Chapter

    Pages 143-173

    Mixed-Signal Test

  8. No Access

    Chapter

    Pages 175-196

    Input-Output Test

  9. No Access

    Chapter

    Pages 197-223

    Design for Testability — Structured Test Approaches

  10. No Access

    Chapter

    Pages 225-234

    System on a Chip (SoC) Test

  11. No Access

    Chapter

    Pages 235-255

    Test Pattern Generation and Fault Simulation

  12. No Access

    Chapter

    Pages 257-266

    Automatic Test Equipment (ATE) and Production Test

  13. No Access

    Chapter

    Pages 267-274

    Test Economics

  14. Back Matter

    Pages 275-362