Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002

  • Paula Maria Vilarinho
  • Yossi Rosenwaks
  • Angus Kingon
Conference proceedings

Part of the NATO Science Series II: Mathematics, Physics and Chemistry book series (NAII, volume 186)

Table of contents

  1. Front Matter
    Pages i-xxxvii
  2. Fundamentals of Functional Materials

  3. Fundamentals of Scanning Probe Techniques

    1. K.F. Kelly, Z.J. Donhauser, B.A. Mantooth, P.S. Weiss
      Pages 153-171
    2. S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi et al.
      Pages 173-195
  4. Application of Scanning Techniques to Functional Materials

    1. A. Gruverman
      Pages 223-249
    2. M. Morgenstern
      Pages 251-273
    3. S. Morita, T. Uchihashi, K. Okamoto, M. Abe, Y. Sugawara
      Pages 289-308
    4. S.R. Cohen, R. Maoz, J. Sagiv
      Pages 309-331
    5. K.F. Kelly, Z.J. Donhauser, P.A. Lewis, R.K. Smith, P.S. Weiss
      Pages 333-354
  5. Contributed papers

    1. A. Pasquini, G.B. Picotto, M. Pisani
      Pages 357-362
    2. C. Canalias, R. Clemens, J. Hellström, F. Laurell, J. Wittborn, H. Karlsson
      Pages 363-369
    3. D.R. Oliver, K.M. Cheng, A. PU, D.J. Thomson, G.E. Bridges
      Pages 371-385
    4. A. Wawro, L.T. Baczewski, P. Pankowski, P. Aleszkiewicz, M. Kisielewski, I. Sveklo et al.
      Pages 435-442
    5. A.-M. Chiorcea, A.M. Oliveira Brett
      Pages 467-473
  6. Back Matter
    Pages 485-488

About these proceedings


As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.


Gold Nanotube dynamics electronics nanoscience nanostructure nanotechnology photoelektrochemische Zelle thin film

Editors and affiliations

  • Paula Maria Vilarinho
    • 1
  • Yossi Rosenwaks
    • 2
  • Angus Kingon
    • 3
  1. 1.University of AveiroPortugal
  2. 2.Tel Aviv UniversityRamat - AvivIsrael
  3. 3.NCSURaleighUSA

Bibliographic information