Abstract
To improve the speed of an atomic force microscope (AFM), one must improve the bandwidth of its components, and the lateral XY scanner is no exception. Sinusoidal raster scans provide a simple way of improving lateral scan rates without the need for additional hardware and/or complex control algorithms. However, a raster scan using a sinusoidal waveform leads to a non-uniform probesample velocity. Uniform spatial sampling of scan data can be achieved in this case by varying the sampling rate as the probe sample velocity varies. In this work, we present a field-programmable gate array (FPGA)-based implementation of a sinusoidal raster scan with uniform spatial sampling for a high-speed atomic force microscope (HS-AFM). Using a home-made HS-AFM scanner and a custom controller, we demonstrate the performance of our approach by imaging Blu-ray disk data tracks in the contact mode. While the results show images comparable to those acquired using the traditional triangular raster scans, mirroring effects are better suppressed in high-speed imaging with sinusoidal scan signals.
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References
T. Ando, Biophys. Rev. 10, 285 (2018).
A. J. Fleming, Ultramicroscopy 110, 1205 (2010).
D. Croft, G. Shed and S. Devasia, J. Dyn. Syst. Meas. Control 123, 35 (2001).
G. Schitter et al., IEEE Trans. Control Syst. Technol. 15, 906 (2007).
K. Miyata et al., Rev. Sci. Instrum. 84, 043705 (2013).
H. Habibullah, H. R. Pota and I. R. Petersen, Sens. Actuators A 292, 137 (2019).
A. J. Fleming and A. G. Willis, IEEE Trans. Control Syst. Technol. 17, 552 (2009).
A. P. Nievergelt et al., in 2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), (Munich, Germany, 2017), p. 731.
A. D. L. Humphris, M. J. Miles and J. K. Hobbs, Appl. Phys. Lett. 86, 034106 (2005).
L. M. Picco et al., Nanotechnology 18, 044030 (2006).
Y. R. Teo, Y. Yong and A. J. Fleming, Asian J. Control 20, 1352 (2018).
S. K. Das et al., IEEE Access 7, 115603 (2019).
N. Nikooienejad, M. Maroufi and S. O. R. Moheimani, Rev. Sci. Instrum. 90, 073702 (2019).
G. E. Fantner et al., Rev. Sci. Instrum. 76, 026118 (2005).
P. K. Hansma, G. Schitter, G. E. Fantner and C. Prater, Science 314, 601 (2006).
T. Ando et al., Jpn. J. Appl. Phys. 41, 4851 (2002).
Acknowledgments
This work is supported by the Basic Science Research Program through the National Reasearch Foundation of Korea (NRF) funded by the Ministry of Science and ICT (2018R1A2B6008264).
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Otieno, L.O., Lee, Y.J. & Alunda, B.O. Implementation of a Sinusoidal Raster Scan for High-Speed Atomic Force Microscopy. J. Korean Phys. Soc. 77, 605–612 (2020). https://doi.org/10.3938/jkps.77.605
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DOI: https://doi.org/10.3938/jkps.77.605