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Conceptual Design of the High Voltage Platform by Using the Aluminum Profile for Considering Dielectric Breakdown for the RAON ECRIS

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Abstract

We designed and manufactured a 28-GHz electron cyclotron resonance ion source (ECRIS) to obtain a steady heavy-ion beam. The ECRIS consists of various equipment for beam extraction and transmission, such as superconducting magnet, electro static quadrupole (ESQ), pair solenoid magnet, dipole magnet and etc. For the support frame of ECRIS, it is necessary to use a material with high strength must be used for stable support, and it should be easy to assemble for installation. In addition, dielectric breakdown should not occur at a high voltage applied when the beam is extracted. The manufactured frame is currently made of steel pipe, which has excellent in strength and dielectric characteristic. However assembly and installation is not convenient due to weight, corrosion, welding, etc. In order to overcome this problem, we redesigned a new frame using an aluminum profile. the advantages of the aluminum profile are easy acquisition, low cost, high strength, and easy assembly and installation. However, dielectric breakdown may occur at the edge of the aluminum profile. Therefore, a high-voltage electricfield analysis is required to design the support frame of the ECRIS. This paper, reports on the design of a high voltage support frame through an electricfield analysis using a finite element method (FEM) and a breakdown experiment.

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References

  1. S. K. Kim et al., Baseline Design Summary, http://risp.ibs.re.kr/orginfo/infoblds.do.

  2. H. Kang and T. K. Ko, IEEE Trans. Appl. Supercond. 21, 1322 (2011).

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Acknowledgments

This work was supported by the Rare Isotope Science Project of the Institute for Basic Science funded by Ministry of Science and |Ict and by the National Research Foundation (NRF) of Korea (2013M7A1A1075764).

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Correspondence to Jeongil Heo.

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Heo, J., Kim, Y. & Shin, T. Conceptual Design of the High Voltage Platform by Using the Aluminum Profile for Considering Dielectric Breakdown for the RAON ECRIS. J. Korean Phys. Soc. 76, 654–657 (2020). https://doi.org/10.3938/jkps.76.654

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  • DOI: https://doi.org/10.3938/jkps.76.654

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