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Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

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Abstract

We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, T g = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around T g .

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Authors and Affiliations

  1. Spin Engineering Physics Team, Korea Basic Science Institute (KBSI), Daejeon, 34133, Korea

    Jun Hee Han

  2. Department of Physics, Korea University, Seoul, 02841, Korea

    Kyu Won Lee & Cheol Eui Lee

  3. Faculty of Science Education, Jeju National University, Jeju, 63243, Korea

    Se-Hun Kim

Authors
  1. Jun Hee Han
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  2. Kyu Won Lee
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  3. Cheol Eui Lee
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  4. Se-Hun Kim
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Correspondence to Cheol Eui Lee.

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Han, J.H., Lee, K.W., Lee, C.E. et al. Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane. Journal of the Korean Physical Society 72, 476–479 (2018). https://doi.org/10.3938/jkps.72.476

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  • DOI: https://doi.org/10.3938/jkps.72.476

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