Abstract
Highly transparent yttrium oxide thin films doped with europium (Y2O3:Eu) were fabricated and their optical, luminescent, and structural properties were investigated. Thin films of Y2O3:Eu were deposited on fused quartz substrates by using a radio-frequency (RF) magnetron sputtering method and subsequently annealed at 1000 °C for 1 hour in air atmosphere. The resultant Y2O3:Eu films showed a high optical transmittance, greater than 82%, in the visible wavelength range above 400 nm and up to 92% transmittance in the near-infrared range. The optical band gap of the films was determined to be approximately 5.77 eV. The refractive index of the films ranged between 1.854 and 1.767 in the visible wavelength region from 400 to 700 nm. X-ray diffraction (XRD) measurements revealed that the films had a cubic crystal structure of Y2O3 and were strongly textured along the [100] direction. The Y2O3:Eu films exhibited a red photoluminescence emission with a dominant peak centered at around 612 nm due to the 5D0 → 7F2 transition of Eu3+ ion. The excitation spectrum showed a broad band in the ultraviolet (UV) wavelength region corresponding to the O2−−Eu3+ charge transfer band.
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Chung, M.H., Kim, J.H. Optical, Luminescent, and Structural Properties of Highly Transparent Yttrium Oxide Thin Films Doped with Europium. Journal of the Korean Physical Society 72, 431–435 (2018). https://doi.org/10.3938/jkps.72.431
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DOI: https://doi.org/10.3938/jkps.72.431