Abstract
A high degree of accuracy in bulk micromachining is essential to fabricate micro-electro-mechanical systems (MEMS) devices. A series of etching experiments is carried out using 40 wt% KOH solutions at the constant temperature of 70 °C. Before wet etching, SF6 and O2 are used as the dry etching gas to etch the masking layers of a 100 nm thick Si3N4 and SiO2, respectively. The experimental results indicate that (100) silicon wafer form the pyramidal structures with (111) single crystal planes. All the etch profiles are analyzed using Scanning Electron Microscope (SEM) and the wet etch rates depend on the opening sizes. The manufactured pyramidal structures are used as the pattern of silicon mold. After a short hardening of coated polydimethylsiloxane (PDMS) layer, micro pyramidal structures are easily transferred to PDMS layer.
Similar content being viewed by others
References
J. M. Bustillo, R. T. Howe and R. S. Muller, Proc. IEEE 86, 1552 (1998).
B. H. Jo, L. M. Van Lerberghe, K. M. Motsegood and D. J. Beebe, J. Microelectromech. Syst. 9, 76 (2000).
G. T. Akovacs, N. I. Maluf and K. E. Petersen, Proc. IEEE 86, 1536 (1998).
A. Goyal, R. C. Jaeger, S. H. Bhavnani, C. D. Ellis, N. K. Phadke, M. Azimi-Rashti and J. S. Goodling, IEEE Electron Device Lett. 14, 29 (1993).
K. Biswas and S. Kal, Microelectron. J. 37, 519 (2006).
Q. Jiao, X. Tan, J. Zhu, S. Feng and J. Gao, Ultrason. Sonochem. 31, 222 (2016).
C. R. Yang, P. Y. Chen, Y. C. Chiou and R. T. Lee, Sens. Actuators A 119, 263 (2005).
Q. Michael and S. Julian, Semiconductor manufacturing technology (Prentice Hall, US, 2001), Vol. 1, p. 446.
L. M. Landsberger, S. Nsaeh, M. Kahrizi and M. Paranjape, J. Microelectromech. syst. 5, 106 (1996).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Hwang, S., Lim, K., Shin, H. et al. Micro-pyramidal structure fabrication on polydimethylsiloxane (PDMS) by Si (100) KOH wet etching. Journal of the Korean Physical Society 71, 506–509 (2017). https://doi.org/10.3938/jkps.71.506
Received:
Published:
Issue Date:
DOI: https://doi.org/10.3938/jkps.71.506