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A study on the radiation resistance of CdWO4 thin-film scintillators deposited by using an electron-beam physical vapor deposition method

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Abstract

In this paper, we report the first successful fabrication of CdWO4 thin film scintillators deposited on quartz glass substrates by using an electron-beam physical vapor deposition method. The films were dense, uniform, and crack-free. CdWO4 thin-film samples of varying thicknesses were investigated by using structural and optical characterization techniques. An optimized thickness for the CdWO4 thin-film scintillators was discovered. The scintillation and the optical properties were found to depend strongly on the annealing process. The annealing process resulted in thin films with a distinct crystal structure and with improved transparency and scintillation properties. For potential applications in gamma-ray energy storage systems, photoluminescence measurements were performed using gamma rays at a dose rate of 10 kGy h−1.

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Authors and Affiliations

  1. Department of Nano Science and Technology, Gachon University, Seongnam, 13120, Korea

    Seyong Park

  2. Department of Chemical and Biological Engineering, Gachon University, Seongnam, 13120, Korea

    Young Soo Yoon

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  1. Seyong Park
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  2. Young Soo Yoon
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Correspondence to Young Soo Yoon.

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Park, S., Yoon, Y.S. A study on the radiation resistance of CdWO4 thin-film scintillators deposited by using an electron-beam physical vapor deposition method. Journal of the Korean Physical Society 69, 734–738 (2016). https://doi.org/10.3938/jkps.69.734

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  • DOI: https://doi.org/10.3938/jkps.69.734

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