Abstract
We investigated the electrical stabilities of 6,13-bis(triisopropylsilylethynyl)-pentacene (TIPS-pentacene) thin-film transistors (TFTs) fabricated with cross-linked polymeric insulators, i.e., poly(4-vinylphenol) (PVP) and poly(4-vinylphenol-co-methyl methacrylate) (PVP-co-PMMA). Compared to the cross-linked PVP insulator, the TIPS-pentacene TFTs containing a cross-linked PVP-co-PMMA insulator exhibit less hysteresis upon reversal of the gate-voltage sweep direction and a lower shift in the threshold voltage during consecutive operations, which is ascribed to the relatively hydrophobic surface of the cross-linked PVP-co-PMMA insulator. When these polymer solutions are mixed with yttrium-oxide nanoparticles, the rough surfaces of both nanocomposite insulators lead to larger shifts in the threshold voltage during consecutive operations, but its effect on the hysteretic behavior in the transfer characteristics of the TIPS-pentacene TFTs is negligible. Thus, the influence of the surface properties of the polymeric insulators on the electrical stability of TIPS-pentacene TFTs can be explained through hole-trapping and the delayed-depletion of the holes at the insulator/semiconductor interface.
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Baang, S., Lee, H., Ham, Y. et al. Influence of the surface properties of polymeric insulators on the electrical stability of 6,13-bis(triisopropylsilylethynyl)-pentacene thin-film transistors. Journal of the Korean Physical Society 67, 2124–2130 (2015). https://doi.org/10.3938/jkps.67.2124
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DOI: https://doi.org/10.3938/jkps.67.2124