Journal of the Korean Physical Society

, Volume 63, Issue 3, pp 800–803 | Cite as

Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

  • Kazuto Yamanoi
  • Takashi Manago
  • Satoshi Yakata
  • Takashi Kimura


The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-µm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 µm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 µm, which is a favorable characteristics for various microwave applications.


Ferromagnetic resonance Vector network analyzer Magnetic dot 


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  1. [1]
    C. Thirion, W. Wernsdorfer and D. Mailly, Nat. Mater. 2, 524 (2003).ADSCrossRefGoogle Scholar
  2. [2]
    Y. Nozaki, M. Ohta, S. Taharazako, K. Tateishi, S. Yoshimura and K. Matsuyama, Appl. Phys. Lett. 91, 082510 (2007).ADSCrossRefGoogle Scholar
  3. [3]
    A. Brataas, Y. Tserkovnyak, G. E. W. Bauer and B. I. Halperin, Phys. Rev. B 66, 060404(R) (2002).ADSCrossRefGoogle Scholar
  4. [4]
    S. Mizukami, Y. Ando and T. Miyazaki, Phys Rev. B 66, 104403 (2002).ADSCrossRefGoogle Scholar
  5. [5]
    A. A. Tulapurkar, Y. Suzuki, F. Fukushima, H. Kubota, H. Maekawa, K. Tsunekawa, D. D. Djayaprawira, N. Watanabe and S. Yuasa, Nature 438, 339 (2005).ADSCrossRefGoogle Scholar
  6. [6]
    K. Sekiguchi, K. Yamada, S.-M. Seo, K.-J. Lee, D. Chiba, K. Kobayashi and T. Ono, Phys. Rev. Lett. 108, 017203 (2003).ADSCrossRefGoogle Scholar
  7. [7]
    G. Counil, J.-V. Kim, T. Devolder, C. Chapper, K. Shigeto and Y. Otani, J. Appl. Phys. 95, 5646 (2004).ADSCrossRefGoogle Scholar
  8. [8]
    Y. Ding, T. J. Klemmer and T. M. Crawford, J. Appl. Phys. 96, 2969 (2004).ADSCrossRefGoogle Scholar
  9. [9]
    B. K. Kuanr, R. E. Camley and Z. Celinski, J. Magn. Magn. Mater. 286, 276 (2005).ADSCrossRefGoogle Scholar
  10. [10]
    S. S. Kalarickal, P. Krivosik, M. Wu, C. E. Patton, M. L. Schneider, P. Kabos, T. J. Silva and J. P. Nibarger, J. Appl. Phys. 99, 093909 (2006).ADSCrossRefGoogle Scholar

Copyright information

© The Korean Physical Society 2013

Authors and Affiliations

  • Kazuto Yamanoi
    • 1
  • Takashi Manago
    • 1
  • Satoshi Yakata
    • 2
  • Takashi Kimura
    • 2
  1. 1.Department of Applied PhysicsFukuoka UniversityFukuokaJapan
  2. 2.Advanced Electronics Research Division, INAMORI Frontier Research CenterKyushu UniversityFukuokaJapan

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