Journal of the Korean Physical Society

, Volume 63, Issue 3, pp 800–803 | Cite as

Measurement of the ferromagnetic resonance of a single micron dot by using a vector network analyzer

  • Kazuto Yamanoi
  • Takashi Manago
  • Satoshi Yakata
  • Takashi Kimura
Article

Abstract

The ferromagnetic resonance of a single micron-scale dot of permalloy was measured by using a vector network analyzer. The resonant frequency shifted to higher frequency with increasing aspect ratio of the sample. This tendency was remarkable for narrower width samples, especially the 1-µm-width dots. This means that the demagnetization effect of thin films for the ferromagnetic resonance becomes large when the sample width is less than 1 µm. The resonant frequency can be largely controlled by changing the sample width for a thin film with a width of less than 1 µm, which is a favorable characteristics for various microwave applications.

Keywords

Ferromagnetic resonance Vector network analyzer Magnetic dot 

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Copyright information

© The Korean Physical Society 2013

Authors and Affiliations

  • Kazuto Yamanoi
    • 1
  • Takashi Manago
    • 1
  • Satoshi Yakata
    • 2
  • Takashi Kimura
    • 2
  1. 1.Department of Applied PhysicsFukuoka UniversityFukuokaJapan
  2. 2.Advanced Electronics Research Division, INAMORI Frontier Research CenterKyushu UniversityFukuokaJapan
  3. 3.CRESTJapan Science and Technology AgencySanbancho, TokyoJapan

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