Abstract
Polycrystalline Pb(Zr0.35Ti0.65)O3 thin films prepared on Pt/Ti/SiO2/Si substrate by using solgel technique were characterized by using X-ray diffraction (XRD) and atomic force microscopy (AFM). The optical properties of the films were investigated by using spectroscopic ellipsometry (SE) with a four-phase optical model, air/roughness layer/PZT layer/Pt layer in the spectral range of 300–800 nm. The optical band gap of the films calculated following the Tauc’s Law was smaller than that of an amorphous PZT thin film with some microcrystals existing on the surface. The result indicates that the quantum-size effect leads to an increase in band gap when the crystalline dimensions become very small.
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References
N. Izyumskaya, Y. I. Alivov, S. J. Cho, H. Morkoç, H. Lee and Y. S. Kang, Crit. Rev. Solid State Mater. Sci. 32, 111 (2007).
A. Q. Jiang, Z. H. Chen, W. Y. Hui, D. P. Wu and J. F. Scott, Adv. Func. Mater. 22, 10 (2012).
K. Sreenivas, M. Sayer, D. J. Baar and M. Nishioka, Appl. Phys. Lett. 52, 709 (1988).
H. Adachi, T. Mitsuyu, O. Yamazaki and K. Wasa, J. Appl. Phys. 60, 736 (1986).
K. Iijima, Y. Tomita, R. Takayama and I. Ueda, J. Appl. Phys. 60, 361 (1986).
S. G. Varnado and W. D. Smith, IEEE J. Quant. Electron. QE-8, 88 (1972).
C. M. Foster, G. R. Bai, R. Csencsits, J. Vetrone, R. Jammy, L. A. Wills, E. Carr and J. Amano, J. Appl. Phys. 81, 2349 (1997).
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley & Sons, Ltd., West Sussex, England, 2007).
Z. H. Dai, R. J. Zhang, J. Shao, Y. M. Chen, Y. X. Zheng, J. D. Wu and L. Y. Chen, J. Korean Phys. Soc. 55, 1227(2009).
S. H. Yang, Y. L. Zhang and D. Mo, Mater. Sci. Eng. B 127, 117 (2006).
M. Zhao, R. J. Zhang, D. S. Gu and J. P. Xu, J. Infrared Millim. Waves 22, 71 (2003).
Joint Committee on Power Diffraction Standards (JCPDS), Swarthmore, PA (now International Centre for Diffraction Data (ICCD)) (2001).
L. Y. Chen, X. W. Feng, Y. Su, H. Z. Ma and Y. H. Qian, Appl. Opt. 33, 1299 (1994).
R. J. Zhang, Y. M. Chen, W. J. Lu, Q. Y. Cai, Y. X. Zheng and L. Y. Chen, Appl. Phys. Lett. 95, 161109 (2009).
X. G. Tang, H. R. Zeng, A. L. Ding, P. S. Qiu, W. G. Luo, H. Q. Li and D. Mo, Solid State Commun. 116, 507 (2000).
S. H. Hu, X. J. Meng, G. J. Hu, J. H. Chu, N. Dai, L. Xu, L. Y. Liu and D. X. Li, Appl. Phys. Lett. 84, 3609 (2004).
Y. M. Chen, R. J. Zhang, Y. X. Zheng, P. H. Mao, W. J. Lu and L. Y. Chen, J. Korean Phys. Soc. 53, 2299 (2008).
D. Chvostova, L. Pajasova and V. Zelezny, Phys. Status Solidi (c) 5, 1362 (2008).
Z. J. Xu, F. Zhang, R. J. Zhang, X. Yu, D. X. Zhang, Z. Y. Wang, Y. X. Zheng, S. Y. Wang, H. B. Zhao and L. Y. Chen, Appl. Phys. A, Mater. Sci. Process. (2013) DOI 10.1007/s00339-013-7591-9.
A. R. Forouhi and I. Bloomer, Phys. Rev. B 34, 7018(1986).
A. R. Forouhi and I. Bloomer, Phys. Rev. B 38, 1865(1988).
E. D. Palik, Handbook of Optical Constants of Solids (Academic, Orlando, FL, 1985), p. 333.
D. Franta, I. Ohlídal, J. Mistrík, T. Yamaguchi, G. J. Hu and N. Dai, Appl. Surf. Sci. 244, 338 (2005).
S. A. Impey, Z. Huang, A. Patel, R. Beanland, N. M. Shorrocks, R. Watton and R. W. Whatmore, J. Appl. Phys. 83, 2202 (1998).
J. Zaanen, G. A. Sawatzky and J. W. Allen, Phys. Rev. Lett. 55, 418 (1985).
J. C. Tauc, Amorphous and Liquid Semiconductor (Plenum Press, New York, 1974), p. 159.
Z. Zhang, P. Wu, K. P. Ong, L. Lu and C. Shu, Phys. Rev. B 76, 125102 (2007).
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Zhang, F., Zhang, R.J., Wang, Z.Y. et al. Structural characterization and optical properties of Sol-gel-derived polycrystalline Pb(Zr0.35Ti0.65)O3 thin films. Journal of the Korean Physical Society 63, 53–57 (2013). https://doi.org/10.3938/jkps.63.53
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DOI: https://doi.org/10.3938/jkps.63.53