Abstract
Nanocrystallisation of Fe75Cu1Nb3Si8B13 under tensile stress results in a creep induced anisotropy which, at room temperature, is characterised by a magnetic easy axis along the stress axis. However, this magnetic easy ribbon axis becomes a magnetic hard ribbon axis when the measuring temperature T decreases below a compensation temperature T 0 where the creep induced magnetic anisotropy vanishes. Accordingly, the magnetisation curve changes from a square loop for T > T 0 to a linear loop with low remanence forT < T 0. In the present case (8 at% Si), T 0 is about −2 °C for the fully developed nanocrystalline state. Although slightly depending on the annealing conditions, T 0 is primarily determined by the Si content and shifts towards higher temperatures by about 50 °C per at% Si with increasing Si concentration.
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Herzer, G., Marsilius, M. & Polak, C. Temperature dependence of creep induced anisotropy in nanocrystalline Fe-Cu-Nb-Si-B alloys. Journal of the Korean Physical Society 62, 1465–1468 (2013). https://doi.org/10.3938/jkps.62.1465
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DOI: https://doi.org/10.3938/jkps.62.1465