Abstract
Zn1−x Mg x O films with various Mg contents were fabricated by using the atomic layer deposition technique. The optical properties of the Zn1−x Mg x O films were analyzed by using photoluminescence (PL) measurements for various of temperatures (5 K ∼ 300 K). For low-temperature PL measurements, as the Mg content was increased, the peak transition energy of the bound exciton increased due to band-gap expansion which enabled us to evaluate Mg content (x). As the temperature was raised, a pronounced blue-shift was observed due to the transformation from a bound to a free exciton by the absorption of thermal energy.
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Shin, Y.H., Kim, Y. Photoluminescence study of ZnMgO films fabricated by using the atomic layer deposition method. Journal of the Korean Physical Society 61, 594–598 (2012). https://doi.org/10.3938/jkps.61.594
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DOI: https://doi.org/10.3938/jkps.61.594