Optimization of a photon rejecter to separate electronic noise in a photon-counting detector

Abstract

Photon-counting-based X-ray imaging technology provides the capability to count individual photons and to characterize photon energies. The cadmium telluride (CdTe)-based photon-counting detector is limited in capability, however, under a high X-ray flux. A photon rejecter composed of aluminum, for example, can reduce this limitation by modulating the incident number of photons. In addition to this function, the optimal photon rejecter can separate electronic noise, which degrades image quality. The aim of this work was to optimize a photon rejecter for high-quality image acquisition by removing electronic noise from the actual pulse signal. The images and spectra were acquired using a micro-focus X-ray source with a CdTe-based photon-counting detector. We acquired data with various types of photon-rejecter materials composed of aluminum (Al) and iodine at three different tube voltages (50, 70, and 90 kVp). A phantom composed of high-atomic-number materials was imaged to evaluate the efficiency of the photon rejecter. Photon rejecters composed of 1-mm Al, 10-mm Al, and a combination of 10-mm Al and iodine provided optimum capability at 50, 70, and 90 kVp, respectively. Each optimal combination of photon-rejecter material and voltage effectively separated electronic noise from the actual pulse signal and gave the highest contrast-tonoise ratio for materials on the image. These optimized types of photon rejecters can effectively discriminate electronic noise and improve image quality at different tube voltages.