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Surface pattern of a Si Mini-Pad sensor for the PHENIX MPC-EX and damage caused by ionizing radiation

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Abstract

The Si Mini-Pad sensor is an essential component of the MPC-EX preshower detector. This detector will be integrated into the PHENIX experiment at Brookhaven National Laboratory’s Relativistic Heavy Ion Collider. We describe the development of the surface pattern and the fabrication process of the Si Mini-Pad sensor and present a test by the low energy γ irradiation that is sensitive to the surface design.

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Author information

Authors and Affiliations

  1. Physics Department, Brookhaven National Laboratory, Upton, New York, 11973-5000, USA

    E. Kistenev, Z. Li & A. Sukhanov

  2. Chonbuk National University, Jeonju, 561-756, Korea

    E. J. Kim

  3. Electronics and Telecommunications Research Institute, Daejeon, Korea

    J. H. Lee, J. M. Park & K. S. Park

  4. Ewha Womans University, Seoul, 120-750, Korea

    K. I. Hahn & S. Y. Han

  5. Hanyang University, Seoul, 133-792, Korea

    Y. K. Kim

  6. Iowa State University, Ames, Iowa, 50011, USA

    J. G. Lajoie

  7. Myongji University, Yongin, 449-728, Korea

    K. S. Joo & K. S. Lim

  8. Sungkyunkwan University, Suwon, 440-746, Korea

    J. -S. Chai, M. Ghergherehchi & H. S. Song

  9. Xiangtan University, Xiangtan, Hunan, 411105, China

    Z. Li

  10. Yonsei University, Seoul, 120-749, Korea

    I. W. Jeong, Y. Kwon & D. G. Sue

Authors
  1. J. -S. Chai
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  2. M. Ghergherehchi
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  3. K. I. Hahn
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  4. S. Y. Han
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  5. I. W. Jeong
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  6. K. S. Joo
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  7. E. J. Kim
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  8. Y. K. Kim
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  9. E. Kistenev
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  10. Y. Kwon
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  11. J. G. Lajoie
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  12. Z. Li
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  13. J. H. Lee
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  14. K. S. Lim
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  15. J. M. Park
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  16. K. S. Park
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  17. H. S. Song
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  18. D. G. Sue
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  19. A. Sukhanov
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Corresponding author

Correspondence to Y. Kwon.

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Chai, J.S., Ghergherehchi, M., Hahn, K.I. et al. Surface pattern of a Si Mini-Pad sensor for the PHENIX MPC-EX and damage caused by ionizing radiation. Journal of the Korean Physical Society 65, 25–30 (2014). https://doi.org/10.3938/jkps.65.25

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  • DOI: https://doi.org/10.3938/jkps.65.25

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