Journal of the Korean Physical Society

, Volume 60, Issue 11, pp 1915–1922 | Cite as

X-ray magnetic dichroism in (Zn,Mn)O diluted magnetic semiconductors: First-principles calculations

  • V. N. Antonov
  • L. V. Bekenov
  • D. V. Mazur
  • L. P. Germash
Research Papers

Abstract

The electronic structure of (Zn,Mn)O diluted magnetic semiconductors was investigated theoretically from first principles by using the fully-relativistic Dirac linear muffin-tin orbital band structure method with the local spin-density approximation (LSDA) and the LSDA+U approach. The X-ray magnetic circular dichroism (XMCD) spectra at the Mn, Zn, and O K and Mn L 2,3 edges were investigated theoretically from first principles. The origin of the XMCD spectra in these compounds was examined. The effect of oxygen vacancy atoms was found to be crucial for the X-ray magnetic dichroism at the Mn L 2,3 edges. The calculated results are compared with available experimental data.

Keywords

Electronic structure Diluted magnetic semiconductores X-ray magnetic dichroism X-ray absorption spectra 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    J. K. Furdyna, Appl. Phys. Lett. 64, R29 (1988).Google Scholar
  2. [2]
    H. Cao, Z. Pei, J. Gong, C. Sun, R. Huang and L. Wen, J. Solid State Chem. 177, 1480 (2004).CrossRefADSGoogle Scholar
  3. [3]
    T. Dietl, H. Ohno, F. Matsukura, J. Cibert and D. Ferrand, Science 287, 1019 (2000).CrossRefADSGoogle Scholar
  4. [4]
    K. Ueda, H. Tabata and T. Kawai, Appl. Phys. Lett. 79, 988 (2001).CrossRefADSGoogle Scholar
  5. [5]
    C. Liu, F. Yun and H. Morko, J. Mater. Sci. — Mater. Electron. 16, 555 (2005).CrossRefGoogle Scholar
  6. [6]
    T. Fukumura, Z. Jin, M. Kawasaki, T. Shono, T. Hasegawa, S. Koshihara and H. Koinuma, Appl. Phys. Lett. 78, 958 (2001).CrossRefADSGoogle Scholar
  7. [7]
    A. Tiwari, C. Jin, A. Kivt, D. Kumar, J. F. Muth and J. Narayan, Solid State Commun. 121, 371 (2002).CrossRefADSGoogle Scholar
  8. [8]
    S. W. Jung, S. J. An, G. Yi, C. U. Jung, S. Lee and S. Cho, Appl. Phys. Lett. 80, 4561 (2002).CrossRefADSGoogle Scholar
  9. [9]
    X. M. Cheng and C. L. Chien, J. Appl. Phys. 93, 7876 (2003).CrossRefADSGoogle Scholar
  10. [10]
    P. Sharma, A. Gupta, K. V. Rao, F. J. Owens, R. Sharma, R. Ahuja, J. M. O. Guillen, B. Johansson and G. A. Gehring, Nat. Mater. 2, 673 (2003).CrossRefADSGoogle Scholar
  11. [11]
    S. W. Yoon, S. B. Cho, S. C. We, S. Yoon, B. J. Suh, H. K. Song and Y. J. Shin, J. Appl. Phys. 93, 7879 (2003).CrossRefADSGoogle Scholar
  12. [12]
    V. A. L. Roy, A. B. Djurisic, H. Liu, X. X. Zhang, Y. H. Leung, M. H. Xie, J. Gao, H. F. Lui and C. Surya, Appl. Phys. Lett. 84, 756 (2004).CrossRefADSGoogle Scholar
  13. [13]
    J. Luo, J. K. Liang, Q. L. Liu, F. S. Liu, Y. Zhang, B. J. Sun and G. H. Rao, J. Appl. Phys. 97, 086106 (2005).CrossRefADSGoogle Scholar
  14. [14]
    N. S. Norberg, K. R. Kittilstved, J. E. Amonette, R. K. Kukkakapu, D. A. Schwartz and D. R. Gamelin, J. Am. Chem. Soc. 126, 9387 (2004).CrossRefGoogle Scholar
  15. [15]
    D. P. Norton, S. J. Pearton, A. F. Hebard, N. Theodoropoulou, L. A. Boatner and R. G. Wilson, Appl. Phys. Lett. 82, 239 (2003).CrossRefADSGoogle Scholar
  16. [16]
    J. Appl. Phys. 87, 4712 (2000).Google Scholar
  17. [17]
    K. R. Kittilstved, N. S. Norberg and D. R. Gamelin, Phys. Rev. Lett. 94, 147209 (2005).CrossRefADSGoogle Scholar
  18. [18]
    S. S. Kim, J. H. Moon, B. T. Lee, O. S. Song and J. H. Je, J. Appl. Phys. 95, 454 (2004).CrossRefADSGoogle Scholar
  19. [19]
    S. Kolesnik, B. Dabrowski and J. Mais, J. Appl. Phys. 95, 2582 (2004).CrossRefADSGoogle Scholar
  20. [20]
    F. Bondino, K. B. Garg, E. Magnano, E. Carleschi, M. Heinonen, R. K. Singhal, S. K. Gaur and F. Parmigiani, J. Phys. Condens. Matter 20, 275205 (2008).CrossRefADSGoogle Scholar
  21. [21]
    K. Kikoin, Low Temp. Phys. 35, 58 (2009).CrossRefADSGoogle Scholar
  22. [22]
    K. Sato and H. Katayama-Yoshida, Semicond. Sci. Technol. 17, 367 (2002).CrossRefADSGoogle Scholar
  23. [23]
    D. Iuan, B. Sanyal and O. Eriksson, J. Appl. Phys. 101, 09H101 (2007).CrossRefGoogle Scholar
  24. [24]
    O. Mounkachi, A. Benyoussef, A. El Kenz, E. H. Saidi and E. K. Hlil, J. Appl. Phys. 106, 093905 (2009).CrossRefADSGoogle Scholar
  25. [25]
    Y. Uspenskii, E. Kulatov, H. Mariette, H. Nakayama and H. Ohta, J. Magn. Magn. Mater. 258, 248 (2003).CrossRefADSGoogle Scholar
  26. [26]
    D. Karmakar et al., Phys. Rev. B 81, 184421 (2010).CrossRefADSGoogle Scholar
  27. [27]
    L. V. Bekenov, V. N. Antonov, S. Ostanin, A. N. Yaresko, I. V. Maznichenko, W. Hergert, I. Mertig and A. Ernst, Phys. Rev. B 84, 134421 (2011).CrossRefADSGoogle Scholar
  28. [28]
    T. Chanier, M. Sargolzaei, I. Opahle, R. Hayn and K. Koepernik, Phys. Rev. B 73, 134418 (2006).CrossRefADSGoogle Scholar
  29. [29]
    X. Feng, J. Phys. Condens. Matter 16, 4251 (2004).CrossRefADSGoogle Scholar
  30. [30]
    W. Yan et al., Appl. Phys. Lett. 91, 062113 (2007).CrossRefADSGoogle Scholar
  31. [31]
    P. Gopal and N. A. Spaldin, Phys. Rev. B 74, 094418 (2006).CrossRefADSGoogle Scholar
  32. [32]
    Y. He et al., Phys. Rev. B 78, 155202 (2008).CrossRefADSGoogle Scholar
  33. [33]
    E. Liu, Y. He and J. Z. Jiang, Appl. Phys. Lett. 93, 132506 (2008).CrossRefADSGoogle Scholar
  34. [34]
    D. Iušan, R. Knut, B. Sanyal, O. Karis, O. Eriksson, V. A. Coleman, G. Westin, J. M. Wikberg and P. Svedlindh, Phys. Rev. B 78, 085319 (2008).CrossRefADSGoogle Scholar
  35. [35]
    A. L. He, X. Q. Wang, Y. Q. Fan and Y. P. Feng, J. Appl. Phys. 108, 084308 (2010).CrossRefADSGoogle Scholar
  36. [36]
    A. S. Risbud, N. A. Spaldin, Z. Q. Chen, S. Stemmer and R. Seshadri, Phys. Rev. B 68, 205202 (2003).CrossRefADSGoogle Scholar
  37. [37]
    N. A. Spaldin, Phys. Rev. B 69, 125201 (2004).CrossRefADSGoogle Scholar
  38. [38]
    M. H. F. Sluiter, Y. Kawazoe, P. Sharma, A. Inoue, A. R. Raju, C. Rout and U. V. Waghmare, Phys. Rev. Lett. 94, 187204 (2005).CrossRefADSGoogle Scholar
  39. [39]
    E. Badaeva, Y. Feng, D. R. Gamelin and X. Li, New J. Phys. 10, 055013 (2008).CrossRefADSGoogle Scholar
  40. [40]
    P. F. L. L. Zhao, Z. Y. Yu, X. T. Guo, Y. Shen, H. Ye, G. F. Yuan and L. Zhang, J. Appl. Phys. 108, 113924 (2010).CrossRefADSGoogle Scholar
  41. [41]
    L. Petit, T. C. Schulthess, A. Svane, Z. Szotek, W. M. Temmerman and A. Janotti, Phys. Rev. B 73, 045107 (2006).CrossRefADSGoogle Scholar
  42. [42]
    K. Sato et al., Rev. Mod. Phys. 82, 1633 (2010).CrossRefADSGoogle Scholar
  43. [43]
    M. Sukkar and H. Tuller, Advances in Ceramics, edited by M. F. Yan and A. H. Heuer (American Ceramic Society, Columbus, Ohio, 1983), Vol. 7, p. 71.Google Scholar
  44. [44]
    G. D. Mahan, J. Appl. Phys. 54, 3825 (1983).CrossRefADSGoogle Scholar
  45. [45]
    K. I. Hagemark, J. Solid State Chem. 16, 293 (1976).CrossRefADSGoogle Scholar
  46. [46]
    J. S. Choi and C. H. Yo, J. Phys. Chem. Solids 37, 1149 (1976).CrossRefADSGoogle Scholar
  47. [47]
    A. W. Sleight and R. Wang, Solid-State Chemistry of Inorganic Materials, edited by P. K. Davies, A. J. Jacobson, C. C. Torardi and T. A. Vanderah (Materials Research Society, Pittsburgh, 1996), Vol. 453 of MRS Symposia Proceedings, p. 323.Google Scholar
  48. [48]
    J. W. Hoffman and I. Lauder, Trans. Faraday Soc. 66, 2346 (1970).CrossRefGoogle Scholar
  49. [49]
    E. Ziegler, A. Heinrich, H. Oppermann and G. Stöver, Phys. Status Solidi A 66, 635 (1981).CrossRefADSGoogle Scholar
  50. [50]
    Bo Gu, N. Bulut and S. Maekawa, J. Appl. Phys. 104, 103906 (2008).CrossRefADSGoogle Scholar
  51. [51]
    T. Shinagawa, M. Izaki, K. Murase, T. Uruga, T. Nakamura, Y. Matsumura and Y. Awakura, J. Electrochem. Soc. 153, G168 (2006).CrossRefGoogle Scholar
  52. [52]
    J. H. Guo, A. Gupta et al., J. Phys. Condens. Matter 19, 172202 (2007).CrossRefADSGoogle Scholar
  53. [53]
    Y. J. Kang, D. S. Kim, S. H. Lee, J. Park, J. Chang, J. Y. Moon, G. Lee, J. Yoon, Y. Jo and M. H. Jung, J. Phys. Chem. C 111, 14956 (2007).CrossRefGoogle Scholar
  54. [54]
    P. Thakur, K. H. Chae, J. Y. Kim, M. Subramanian, R. Jayavel and K. Asokan, Appl. Phys. Lett. 91, 14956 (2007).Google Scholar
  55. [55]
    T. C. Droubay, D. J. Keavney, T. C. Kaspar, S. M. Heald, C. M. Wang, C. A. Johnson, K. M. Whitaker, D. R. Gamelin and S. A. Chambers, Phys. Rev. B 79, 155203 (2009).CrossRefADSGoogle Scholar
  56. [56]
    N. R. S. Farley, K. W. Edmonds, A. A. Freeman, G. van der Laan, C. R. Staddon, D. H. Gregory and B. L. Gallagher, New J. Phys. 10, 055012 (2008).CrossRefADSGoogle Scholar
  57. [57]
    A. D. Trolio, R. Larciprete, S. Turchini and N. Zema, Appl. Phys. Lett. 97, 052505 (2010).CrossRefADSGoogle Scholar
  58. [58]
    F. Schoofs, T. Fix, A. M. H. R. Hakimi, S. S. Dhesi, G. van der Laan, S. A. Cavill, S. Langridge, J. L. MacManus-Driscoll and M. G. Blamire, J. Appl. Phys. 108, 053911 (2010).CrossRefADSGoogle Scholar
  59. [59]
    C. A. Johnson, K. R. Kittilstved, T. C. Kaspar, T. C. Droubay, S. A. Chambers, G. M. Salley and D. R. Gamelin, Phys. Rev. B 82, 115202 (2010).CrossRefADSGoogle Scholar
  60. [60]
    P. Thakur, K. H. Chae, M. Subramanian, R. Jayavel and K. Asokan, J. Korean Phys. Soc. 53, 2821 (2008).CrossRefADSGoogle Scholar
  61. [61]
    P. Thakur, S. Gautan, K. H. Chae, M. Subramanian, R. Jayavel and K. Asokan, J. Korean Phys. Soc. 55, 177 (2008).Google Scholar
  62. [62]
    A. A. Freeman et al., Phys. Rev. B 77, 073304 (2008).CrossRefADSGoogle Scholar
  63. [63]
    Y. Jiang et al., J. Phys. Conf. Ser. 190, 1 (2009).Google Scholar
  64. [64]
    V. N. Antonov, H. A. Dürr, Y. Kucherenko, L. V. Bekenov and A. N. Yaresko, Phys. Rev. B 72, 054441 (2005).CrossRefADSGoogle Scholar
  65. [65]
    V. N. Antonov, O. Jepsen, A. N. Yaresko and A. P. Shpak, J. Appl. Phys. 100, 043711 (2006).CrossRefADSGoogle Scholar
  66. [66]
    V. N. Antonov, A. N. Yaresko and O. Jepsen, Phys. Rev. B 81, 075209 (2010).CrossRefADSGoogle Scholar
  67. [67]
    O. K. Andersen, Phys. Rev. B 12, 3060 (1975).CrossRefADSGoogle Scholar
  68. [68]
    V. V. Nemoshkalenko, A. E. Krasovskii, V. N. Antonov, V. N. Antonov, U. Fleck, H. Wonn and P. Ziesche, Phys. Status Solidi B 120, 283 (1983).CrossRefADSGoogle Scholar
  69. [69]
    S. Saib and N. Bouarissa, Physica B 387, 377 (2007).CrossRefADSGoogle Scholar
  70. [70]
    P. E. Blöchl, Phys. Rev. B 50, 17953 (1994).CrossRefADSGoogle Scholar
  71. [71]
    J. P. Perdew, K. Burke and M. Ernzerhof, Phys. Rev. Lett. 78, 1396 (1997).CrossRefADSGoogle Scholar
  72. [72]
    G. Kresse and J. Joubert, Phys. Rev. B 59, 1758 (1999).CrossRefADSGoogle Scholar
  73. [73]
    J. Perdew and Y. Wang, Phys. Rev. B 45, 13244 (1992).CrossRefADSGoogle Scholar
  74. [74]
    P. E. Blöchl, O. Jepsen and O. K. Andersen, Phys. Rev. B 49, 16223 (1994).CrossRefADSGoogle Scholar
  75. [75]
    J. L. Campbell and T. Parr, At. Data Nucl. Data Tables 77, 1 (2001).CrossRefADSGoogle Scholar
  76. [76]
    V. I. Anisimov, J. Zaanen and O. K. Andersen, Phys. Rev. B 44, 943 (1991).CrossRefADSGoogle Scholar
  77. [77]
    A. N. Yaresko, V. N. Antonov and P. Fulde, Phys. Rev. B 67, 155103 (2003).CrossRefADSGoogle Scholar
  78. [78]
    W. E. Pickett and D. J. Singh, Phys. Rev. B 53, 1146 (1996).CrossRefADSGoogle Scholar
  79. [79]
    F. M. F. de Groot, J. C. Fuggle, B. T. Thole and G. A. Sawatzky, Phys. Rev. B 42, 5459 (1990).CrossRefADSGoogle Scholar
  80. [80]
    J. Schwitalla and H. Ebert, Phys. Rev. Lett. 80, 4586 (1998).CrossRefADSGoogle Scholar

Copyright information

© The Korean Physical Society 2012

Authors and Affiliations

  • V. N. Antonov
    • 1
    • 2
  • L. V. Bekenov
    • 2
  • D. V. Mazur
    • 2
  • L. P. Germash
    • 3
  1. 1.Max-Planck-Institut für FestkörperforschungStuttgartGermany
  2. 2.Institute of Metal PhysicsKievUkraine
  3. 3.Kiev Polytechnical InstituteNational Technical University of UkraineKievUkraine

Personalised recommendations