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On the Influence of the Alkaline Composition of Liquid Subphase on the Nafion Film Morphology

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An X-ray reflectivity analysis has shown that the composition of liquid substrates affects the structure of deposited Nafion (Teflon copolymer) films. A model of Nafion monomer, developed based on small-angle X-ray scattering data, is used to interpret the results of X-ray reflectivity analysis.

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This study was performed using equipment of the Shared Research Center of the Federal Scientific Research Centre “Crystallography and Photonics.”


This study was supported by the Ministry of Science and Higher Education of the Russian Federation within a State assignment for the Federal Scientific Research Centre “Crystallography and Photonics” and Kapitza Institute for Physical Problems of the Russian Academy of Sciences.

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Correspondence to V. E. Asadchikov.

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Translated by Yu. Sin’kov

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Asadchikov, V.E., Bunkin, N.F., Volkov, V.V. et al. On the Influence of the Alkaline Composition of Liquid Subphase on the Nafion Film Morphology. Phys. Wave Phen. 29, 131–135 (2021).

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