Abstract
In this work, we describe a technique for the preparation of composites of high-density polyethylene and additives of TlGaSe2, the atomic force microscopy studies of their surface relief, and the analysis of their dielectric properties.
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Original Russian Text © G.A. Mamedov, E.M. Godzhaev, A.M. Magerramov, Sh.A. Zeinalov, 2011, published in Elektronnaya Obrabotka Materialov, 2011, No. 6, pp. 94–98.
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Mamedov, G.A., Godzhaev, E.M., Magerramov, A.M. et al. Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties. Surf. Engin. Appl.Electrochem. 47, 565–569 (2011). https://doi.org/10.3103/S1068375511060123
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DOI: https://doi.org/10.3103/S1068375511060123