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On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid

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Abstract

In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed.

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REFERENCES

  1. Kalashnikov, S.G., Elektrichestvo (Electricity), Moscow: Nauka, 1970.

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  2. Khorolsky, V.Ya., Ershov, A.B., and Khabarov, A.N., Theory and specific design of the installation for testing of power diodes with high shock current, Prikasp. Zh., Upr. Vys. Tekhnol., 2011, no. 4 (16).

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Authors and Affiliations

  1. Stavropol State Agrarian University, 355017, Stavropol, Russia

    V. N. Shemyakin, M. A. Mastepanenko, V. Ya. Khorolsky, A. V. Efanov & I. N. Vorotnikov

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  1. V. N. Shemyakin
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  2. M. A. Mastepanenko
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  3. V. Ya. Khorolsky
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  4. A. V. Efanov
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  5. I. N. Vorotnikov
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Corresponding author

Correspondence to V. N. Shemyakin.

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Translated by A. Ivanov

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Shemyakin, V.N., Mastepanenko, M.A., Khorolsky, V.Y. et al. On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid. Russ. Electr. Engin. 92, 401–403 (2021). https://doi.org/10.3103/S1068371221070099

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  • DOI: https://doi.org/10.3103/S1068371221070099

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