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Change in dielectric strength of vacuum interrupters at reduced service life

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Abstract

The dielectric strengths of two samples of the same type of vacuum interrupter are compared. One vacuum interrupter is a new and has not been tested for switching ability after manufacturing and the other is a vacuum interrupter with a 70% reduced service life. Tests of the dielectric strength are conducted using a standard lighting pulse. Studies have shown that electric breakdowns behind the front of a lighting pulse are caused by electric breakdowns in the screen system of the vacuum interrupter. Possible reasons for the decrease in the dialectric strength of the screen system are discussed.

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Authors
  1. D. F. Alferov
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  2. L. A. Rylskaya
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  3. V. A. Sidorov
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Additional information

Original Russian Text © D.F. Alferov, L.A. Rylskaya, V.A. Sidorov, 2010, published in Elektrotekhnika, 2010, No. 11, pp. 25–31.

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Alferov, D.F., Rylskaya, L.A. & Sidorov, V.A. Change in dielectric strength of vacuum interrupters at reduced service life. Russ. Electr. Engin. 81, 593–598 (2010). https://doi.org/10.3103/S1068371210110040

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  • DOI: https://doi.org/10.3103/S1068371210110040

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