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Remote Optical Temperature Sensing Using a Flat-Parallel Dielectric Wafer

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Journal of Contemporary Physics (Armenian Academy of Sciences) Aims and scope

Abstract

It is demonstrated that reflection of a continuous-wave single-frequency laser radiation from a thick flat-parallel glass wafer can be used for precise remote measurement of temperature. Such measurement relies on the low-finesse Fabry-Pérot nature of the dielectric wafer, whose optical thickness depends on temperature due to two characteristics of the dielectric material: the linear expansion coefficient and the thermo-optic coefficient. For the used glass wafer with a refractive index of 1.5183 and a thickness of 15.75 mm, the temperature distance between adjacent interference peaks was 1.4825°C, which made it possible to measure the temperature with a mean accuracy of 0.005°C. Performance aspects of the proposed temperature sensor and its practical applicability are analyzed.

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Authors and Affiliations

  1. Russian–Armenian University, Yerevan, Armenia

    V. A. Harutyunyan & A. V. Papoyan

  2. Institute for Physical Research, NAS of Armenia, Ashtarak, Armenia

    A. V. Papoyan

Authors
  1. V. A. Harutyunyan
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  2. A. V. Papoyan
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Correspondence to V. A. Harutyunyan.

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The authors declare no conflict of interest.

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Translated by V.A. Harutyunyan

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Harutyunyan, V.A., Papoyan, A.V. Remote Optical Temperature Sensing Using a Flat-Parallel Dielectric Wafer. J. Contemp. Phys. 56, 192–195 (2021). https://doi.org/10.3103/S106833722103004X

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  • DOI: https://doi.org/10.3103/S106833722103004X

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