Abstract
The dependence of the integrated intensity of X-ray beams diffracted from a single crystal of ammonium dihydrogen phosphate (ADP) in the Laue geometry on the applied temperature gradient has been investigated. It is found that the integrated intensity of the X-ray beam reflected from a single crystal depends almost linearly on the magnitude of the temperature gradient, applied perpendicular to the reflecting atomic planes, up to saturation. For small values of the temperature gradient, in case of antiparallel vectors of diffraction and temperature gradient, integrated intensity of the reflected X-rays is initially reduced by about 10% and then increases monotonically with increasing value of the temperature gradient. Based on the theoretical analysis, an explanation of the observed phenomena is given.
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Original Russian Text © V.Gh. Mirzoyan, K.G. Truni, P.A. Grigoryan, K. M. Gevorgyan, M. Ghannad Dezfouli, 2014, published in Izvestiya NAN Armenii, Fizika, 2014, Vol. 49, No. 2, pp. 121–129.
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Mirzoyan, V.G., Truni, K.G., Grigoryan, P.A. et al. Dynamical diffraction of X-rays in ADP single crystal under influence of temperature gradient. J. Contemp. Phys. 49, 74–79 (2014). https://doi.org/10.3103/S1068337214020066
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DOI: https://doi.org/10.3103/S1068337214020066