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Near-field scanning microwave microscope application on Cu-phthalocyaninethin-film organic field-effect transistor

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Journal of Contemporary Physics (Armenian Academy of Sciences) Aims and scope

Abstract

By the standard vacuum evaporation technique Cu(II)-phthalocyanine (Cu-Pc) thin films have been fabricated. For the samples, prepared at room temperature and post-annealed from 100°C to 350°C temperatures, optical spectra in the visible and near IR ranges have been measured. By using nondestructive near-field scanning microwave microscopy organic field-effect transistor (OFET) based on Cuphthalocyanine thin films have been investigated. The changes of crystal structure of Cuphthalocyanine thin film from the α- to the β-phase were controlled by the temperature of annealing. The values of holes’ mobility and the electroconductivity of Cu-phthalocyanine thin films have been obtained depending on the annealing temperature.

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Authors and Affiliations

  1. Yerevan State University, Yerevan, Armenia

    T. A. Sargsyan

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  1. T. A. Sargsyan
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Original Russian Text © T.A. Sargsyan, 2011, published in Izvestiya NAN Armenii, Fizika, 2011, Vol. 46, No. 3, pp. 185–193.

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Sargsyan, T.A. Near-field scanning microwave microscope application on Cu-phthalocyaninethin-film organic field-effect transistor. J. Contemp. Phys. 46, 119–124 (2011). https://doi.org/10.3103/S1068337211030066

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  • DOI: https://doi.org/10.3103/S1068337211030066

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