KRIOSBOM101 low-temperature scanning near-field optical microscope
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An optical scanning near-field microscope was developed. A cryostat for obtaining low temperatures in the range of 1.8–300 K was designed. The microscope control unit and software were advanced taking into account the temperature range. A room-temperature measurement technique was refined on test aluminum gratings on glass with a period of 4 µm. An optimum size of the scan field, which makes it possible to neglect piezoceramics nonlinearities, was determined.
Key wordsscanning microscopy probe microscopy near field low temperatures
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- 1.D. W. Pohl, “Scanning Near-Field Optical Microscopy (SNOM)”, in Advances in Optical and Electron Microscopy (London, Academic, 1991), Vol. 12, p. 243.Google Scholar
- 2.Th. Hartmann, R. Gatz, W. Wiegrabe, et al., NATO Adv. Stud. Inst. E 242, 35 (1993).Google Scholar
- 3.U.Ch. Fischer, NATO Adv. Stud. Inst. E 184, 475 (1990).Google Scholar
- 8.H. D. Robinson, PhD Thesis (Boston University Graduate School of Arts and Science, Boston, 2000).Google Scholar
- 10.M. N. Libenson, “Diffraction Limit Overcoming in Optics,” Soros Obrazovat. Zh. 6, 99 (2000).Google Scholar