Bulletin of the Lebedev Physics Institute

, Volume 36, Issue 1, pp 8–13 | Cite as

Integral and temporal characteristics of soft X-rays of the PF-4 plasma focus setup

  • S. P. Eliseev
  • V. Ya. Nikulin
  • P. V. Silin


Soft X-rays of a setup with a power from 1.5 to 5 kJ, operating with argon, were measured using X-ray pinhole cameras and SPPD 11-04 detectors. Integral measurements of X-rays in energy ranges above 1.2, 1.5, 1.8, and 2.5 keV were performed using a 4-frame pinhole camera with hole sizes of ∼250 µm. Simultaneously, the X-ray yield was measured with time resolution in the energy region of > 1.8 keV using a semiconductor detector. X-ray characteristics were experimentally studied at a capacitor bank voltage of 8–14 kV and argon pressures from 1.2 to 3 Torr. The size of hot points was estimated using the pinhole camera with a hole size of ∼20 µm as less than 13–25 µm.


Beryllium LEBEDEV Physic Institute Plasma Focus Anode Surface Semiconductor Detector 
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© Allerton Press, Inc. 2009

Authors and Affiliations

  • S. P. Eliseev
  • V. Ya. Nikulin
  • P. V. Silin

There are no affiliations available

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