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Upper estimate of unreliability of schemes in full finite basis (in P 2) for arbitrary faults of gates

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Abstract

We consider the realization of Boolean functions by circuits with unreliable functional gates in a complete finite basis. We assume that each gate of the circuit is exposed to arbitrarily faults, and the gates faults are statistically independent. We construct the circuits for all Boolean functions and get their upper bound of the unreliability, which depends on the “worst” (the most unreliable) of the basic gate.

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References

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Authors and Affiliations

  1. Penza State Technological University, Baidukov passage 1a / Gagarin str. 1, Penza, 440039, Russia

    M. A. Alekhina, Yu. S. Gusynina & T. A. Shornikova

Authors
  1. M. A. Alekhina
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  2. Yu. S. Gusynina
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  3. T. A. Shornikova
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Corresponding author

Correspondence to M. A. Alekhina.

Additional information

Original Russian Text © M.A. Alekhina, Yu.S. Gusynina, T.A. Shornikova, 2017, published in Izvestiya Vysshikh Uchebnykh Zavedenii. Matematika, 2017, No. 12, pp. 80–83.

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Alekhina, M.A., Gusynina, Y.S. & Shornikova, T.A. Upper estimate of unreliability of schemes in full finite basis (in P 2) for arbitrary faults of gates. Russ Math. 61, 70–72 (2017). https://doi.org/10.3103/S1066369X17120088

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  • DOI: https://doi.org/10.3103/S1066369X17120088

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