Abstract
The surface morphology of nanosized copper and nickel films on mica has been studied on a scanning tunneling microscope. The height parameters and fractal dimension of the copper and nickel films of different thicknesses have been determined. Characteristic sizes of structural agglomerates for the copper and nickel films as functions of their thickness are reported. The choice of film thickness and synthesis conditions makes it possible to formulate recommendations for the development of technology for growing structures with a specified surface morphology.
Similar content being viewed by others
REFERENCES
Mwema, F.M., Akinlabi, E.T., Oladijo, O.P., et al., in Modern Manufacturing Processes, Amsterdam: Elsevier, 2020, p. 13.
Ţălu Ş., Yadav, R.P. Mittal, A.K., et al., Opt. Quantum Electron., 2017, vol. 49, no. 7, p. 256.
Nikpasand, K., Elahi, S.M., Sari, A.H., and Boochani, A., Mater. Sci. Pol., 2020, vol. 38, no. 2, p. 328.
Astinchap, B., Optik, 2019, vol. 178, p. 231.
Martynenko, Y.V. and Nagel, M.Y., Nanotechnol. Russ., 2009, vol. 4, no. 9, p. 612.
Korsukov, V.E., Butenko, P.N., Kadomtsev, A.G., et al., Nanosyst.: Phys., Chem., Math., 2018, vol. 9, no. 1, p. 58.
Karbivska, L., Karbivskii, V., Romansky, A., et al., Proc. 39th Int. Conf. on Electronics and Nanotechnology (ELNANO), Piscataway, 2019, p. 214.
Markov, O.I., Khripunov, Yu.V., Emel’yanov, V.M., and Zhusubaliev, Zh.T., Izv. Yugozap. Gos. Univ., Ser. Tekh., Tekhnol., 2019, vol. 9, no. 1, p. 78.
Huang, C. and Yang, C.Z., Appl. Phys. Lett., 1999, vol. 74, no. 12, p. 1692.
Cheng, W., Dong, S., and Wang, E., J. Phys. Chem. B, 2005, vol. 109, no. 41, p. 19213.
Sdobnyakov, N.Yu., Antonov, A.S., and Ivanov, D.V., Morfologicheskie kharakteristiki i fraktal’nyi analiz metallicheskikh plenok na dielektricheskikh poverkhnostyakh (Morphological Characteristics and Fractal Analysis of Metal Films on Dielectric Surfaces), Tver: Tver. Gos. Univ., 2019.
Sdobnyakov, N.Yu., Antonov, A.S., Ivanov, D.V., and Semenova, E.M., in Perspektivnye materialy i tekhnologii (Advanced Materials and Technologies), Minsk: Beloruss. Gos. Univ., 2021, p. 253.
Ivanov, D.V., Antonov, A.S., Sdobnyakov, N.Yu., et al., Fiz.-Khim. Aspekty Izuch. Klasterov, Nanostrukt. Nanomater., 2019, no. 11, p. 138.
Antonov, A.S., Sdobnyakov, N.Yu., Ivanov, D.V., et al., Khim. Fiz. Mezosk., 2017, vol. 19, no. 3, p. 473.
Ivanov, D.V., Antonov, A.S., Sdobnyakov, N.Yu., et al., Fiz.-Khim. Aspekty Izuch. Klasterov, Nanostrukt. Nanomater., 2018, no. 10, p. 291.
Panin, A.V and Shunurov, A.R., Fiz. Mezomekh., 2000, vol. 3, no. 5, p. 101.
Feder, J., Fractals, New York: Plenum, 1988.
Roldughin, V.I., Russ. Chem. Rev., 2003, vol. 72, p. 823.
Samsonov, V.M., Kuznetsova, Y.V., and D’yakova, E.V., Tech. Phys., 2016, vol. 86, no. 2, p. 227.
Ivanov, G.S. and Brylkin, Yu.V., Geom. Graf., 2016, vol. 4, no. 1, p. 4.
Brylkin, Yu.V., Kusov, A.L., and Florov, A.V., Izv. Kabardino-Balkar. Gos. Univ., 2014, vol. 4, no. 5, p. 86.
Belko, A.V., Nikitin, A.V., Strekal’, N.D., and German, A.E., J. Surf. Invest.: X-ray, Synchrotron Neutron Tech., 2009, vol. 3, p. 338.
Wu, M.K. and Friedlander, S.K., J. Colloid Interface Sci., 1993, vol. 159, p. 246.
Oh, C. and Sorensen, C.M., J. Colloid Interface Sci., 1997, vol. 193, p. 17.
Tirado-Miranda, M., Schmitt, A., Callejas-Fernandez, J., et al., Langmuir, 2000, vol. 16, p. 7541.
Wu, M.K. and Friedlander, S.K., J. Colloid Interface Sci., 1993, vol. 159, p. 246.
Douketis, C., Wang, Z., Wang, Z., et al., Prog. Surf. Sci., 1995, vol. 50, nos. 1–4, p. 187.
Zahn, W. and Zösch, A., Fresenius’ J. Anal. Chem., 1995, vol. 365, nos. 1–3, p. 168.
Van Put, A., Vertes, A., Wegrzynek, D., et al., Fresenius’ J. Anal. Chem., 1994, vol. 350, nos. 7–9, p. 440.
Mannelquist, A., Almquist, N., and Fredriksson, S., Appl. Phys. A, 1998, vol. 66, no. 1 (suppl.), p. S891
Zahn, W. and Zösch, A., Fresenius’ J. Anal. Chem., 1997, vol. 358, nos. 1–2, p. 119.
http://gwyddion.net.
Ivanov, D.V., Vasil’ev, S.A., Sdobnyakov, N.Yu., et al., Fiz.-Khim. Aspekty Izuch. Klasterov, Nanostrukt. Nanomater., 2020, no. 12, p. 424.
Makabe, A., Oshikawa, W., and Saitou, M., Trans. Jpn. Soc. Mech. Eng., vol. 67, no. 664, p. 1955.
Torabi, M. and Dolati, A., Int. J. Surf. Sci. Eng., 2016, vol. 10, no. 5, p. 444.
Kolokoltsev, V., Borovitskaya, I., Nikulin, V., et al., Proc. 7th Int. Congress on Energy Fluxes and Radiation Effects, Tomsk, 2020, p. 971.
Arman A., Ţălu, Ş., Luna, C., et al., J. Mater. Sci., 2015, vol. 26, p. 9630.
http://www.digitalsurf.com.
Kuz’menko, A.P., Dint, N., Kuz’ko, A.E., et al., Izv. Vyssh. Uchebn. Zaved., Mater. Elektron. Tekh., 2016, vol. 19, no. 3, p. 195.
Trusov, L.I. and Kholmyanskii, V.A., Ostrovkovye metallicheskie plenki (Island Metal Films), Moscow: Metallurgiya, 1973.
Sdobnyakov, N.Yu. and Sokolov, D.N., Izuchenie termodinamicheskikh i strukturnykh kharakteristik nanochastits metallov v protsessakh plavleniya i kristallizatsii: teoriya i komp’yuternoe modelirovanie (Study of Thermodynamic and Structural Characteristics of Metal Nanoparticles during Melting and Crystallization: Theory and Computer Simulation), Tver: Tver. Gos. Univ., 2018.
Sokolov, Yu.V. and Zheleznyĭ, V.S., Tech. Phys. Lett., 2003, vol. 29, no. 8, p. 627.
Funding
This study was carried out within the State Assignment of the Ministry of Science and Higher Education of the Russian Federation, project no. 0817-2023-0006 and within the State Assignment for the Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences.
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
The authors declare that they have no conflicts of interest.
Additional information
Translated by E. Bondareva
About this article
Cite this article
Ivanov, D.V., Antonov, A.S., Kuz’min, N.B. et al. Regularities of the Formation of Fractal Structures on the Surface of Metallic Films of Different Thicknesses. Bull. Russ. Acad. Sci. Phys. 87, 1425–1431 (2023). https://doi.org/10.3103/S1062873823703434
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.3103/S1062873823703434