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Studying the Possibility of Controlling the Refractive and Reflective Indices in Layered Structures with Defects

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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

The authors examine the possibility of controlling the transmittance and reflectance of a periodic structure with embedded dielectric layers and an applied potential difference. This structure is examined under different conditions using software developed to calculate the investigated coefficients. The characteristics of the layered structure of a sphalerite-type crystal with an applied potential difference are studied. Reflections of a periodic LiF/Si/Ag2O/C structure with an embedded dielectric layer having phonon resonance are considered.

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Authors and Affiliations

  1. Volgograd State University, 400062, Volgograd, Russia

    K. Yu. Verevkina, I. Yu. Verevkin, V. V. Yatsyshen & M. B. Belonenko

Authors
  1. K. Yu. Verevkina
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  2. I. Yu. Verevkin
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  3. V. V. Yatsyshen
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  4. M. B. Belonenko
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Corresponding author

Correspondence to K. Yu. Verevkina.

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The authors declare that they have no conflicts of interest.

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Translated by E. Bondareva

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Verevkina, K.Y., Verevkin, I.Y., Yatsyshen, V.V. et al. Studying the Possibility of Controlling the Refractive and Reflective Indices in Layered Structures with Defects. Bull. Russ. Acad. Sci. Phys. 86, 1458–1462 (2022). https://doi.org/10.3103/S1062873822120279

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  • DOI: https://doi.org/10.3103/S1062873822120279

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