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Formation of the Intrinsic Absorption Edge in Nanostructured Hafnium Dioxide Powder

Bulletin of the Russian Academy of Sciences: Physics volume 86, pages 771–774 (2022)Cite this article

Abstract

Diffuse reflectance spectra of nanostructured monoclinic HfO2 powder are measured at room temperature. The Kubelka–Munk formalism is used to analyze features of the intrinsic absorption edge. The observed spectral dependences are found to be formed with the participation of allowed band-to-band transitions of different types. Direct and indirect bandgap widths are estimated to be 5.61 and 5.31 eV, respectively.

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REFERENCES

  1. Kirm, M., Aarik, J., Jürgens, M., and Sildos, I., Nucl. Instrum. Methods Phys. Res., Sect. A, 2005, vol. 537, nos. 1–2, p. 251.

    Google Scholar 

  2. Manikantan, J., Ramalingam, H.B., Shekar, B.C., et al., Adv. Powder Technol., 2017, vol. 28, no. 7, p. 1636.

    Article  Google Scholar 

  3. Gaskins, J.T., Hopkins, P.E., Merrill, D.R., et al., ECS J. Solid State Sci. Technol., 2017, vol. 6, no. 10.

  4. Gritsenko, V.A., Islamov, D.R., Perevalov, T.V., et al., J. Phys. Chem. C, 2016, vol. 120, no. 36, 19980.

    Article  Google Scholar 

  5. Aarik, J., Mändar, H., Kirm, M., and Pung, L., Thin Solid Films, 2004, vol. 466, nos. 1–2, p. 41.

    Article  ADS  Google Scholar 

  6. Villa, I., Lauria, A., Moretti, F., et al., Phys. Chem. Chem. Phys., 2018, vol. 20, no. 23, 15907.

    Article  Google Scholar 

  7. Lozanov, V.V., Baklanova, N.I., Shayapov, V.R., and Berezin, A.S., Cryst. Growth Des., 2016, vol. 16, no. 9, p. 5283.

    Article  Google Scholar 

  8. Shilov, A.O., Savchenko, S.S., Vokhmintsev, A.S., et al., J. Sib. Fed. Univ. Math. Phys., 2021, vol. 14, no. 2, p. 224.

    Google Scholar 

  9. Shilov, A.O., Savchenko, S.S., Vokhmintsev, A.S., et al., AIP Conf. Proc., 2020, vol. 2313, 030006.

    Article  Google Scholar 

  10. Kubelka, P. and Munk, F., Z. Tech. Phys., 1931, vol. 12, p. 593.

    Google Scholar 

  11. Perevalov, T.V., Aliev, V.S., Gritsenko, V.A., et al., Microelectron. Eng., 2013, vol. 109, p. 21.

    Article  Google Scholar 

  12. Kozhevina, A.V., Vokhmintsev, A.S., Kamalov, R.V., et al., J. Phys.: Conf. Ser., 2017, vol. 917, no. 6, 062031.

    Google Scholar 

  13. Ramo, D.M., Gavartin, J.L., Shluger, A.L., and Bersuker, G., Phys. Rev. B, 2007, vol. 75, no. 20, 205336.

    Article  ADS  Google Scholar 

  14. Gavartin, J.L., Ramo, D.M., Shluger, A.L., et al., Appl. Phys. Lett., 2006, vol. 89, no. 8, 082908.

    Article  ADS  Google Scholar 

  15. Strand, J., Chulkov, S.K., Watkins, M.B., and Shluger, A.L., J. Chem. Phys., 2019, vol. 150, no. 4, 044702.

    Article  ADS  Google Scholar 

  16. Luo, X., Li, Y., Yang, H., et al., Crystals, 2018, vol. 8, no. 6, 248.

    Article  Google Scholar 

  17. Kong, M., Li, B., Guo, C., et al., Coatings, 2019, vol. 9, no. 5, 307.

    Article  Google Scholar 

  18. Cheynet, M.C., Pokrant, S., Tichelaar, F.D., and Rouvière, J.L., J. Appl. Phys., 2007, vol. 101, no. 5, 054101.

    Article  ADS  Google Scholar 

  19. Franta, D., Ohlídal, I., Nečas, D., et al., Thin Solid Films, 2011, vol. 519, no. 18, p. 6085.

    Article  ADS  Google Scholar 

  20. Semaltianos, N.G., Friedt, J.M., Chassagnon, R., et al., J. Appl. Phys., 2016, vol. 119, no. 20, 204903.

    Article  ADS  Google Scholar 

  21. Fan, X., Liu, H., Zhong, B., et al., Appl. Phys. A, 2015, vol. 119, no. 3, p. 957.

    Article  ADS  Google Scholar 

  22. Tauc, J., in Amorphous and Liquid Semiconductors, New York: Plenum, 1974, p. 159.

    Book  Google Scholar 

  23. Vokhmintsev, A.O., Petrenyov, I.A., Kamalov, R.V., and Weinstein, I.A., Nanotecnology, 2022, vol. 33, no. 7, 075208.

    Article  ADS  Google Scholar 

  24. Liu, Q.J., Zhang, N.C., Liu, F.S., and Liu, Z.T., Chin. Phys. B, 2014, vol. 23, no. 4, 047101.

    Article  ADS  Google Scholar 

  25. Perevalov, T.V. and Gritsenko, V.A., Phys.—Usp., 2010, vol. 53, no. 6, p. 561.

    Article  ADS  Google Scholar 

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Funding

The work was supported by the RF Ministry of Science and Higher Education, research project no. FEUZ-2020-0059.

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Authors and Affiliations

  1. FNANOTECH Centre, Ural Federal University, 620002, Yekaterinburg, Russia

    A. O. Shilov, A. S. Vokhmintsev, A. M. A. Henaish & I. A. Weinstein

  2. Department of Physics, Tanta University, 31527, Tanta, Egypt

    A. M. A. Henaish

  3. Institute of Metallurgy, Ural Branch, Russian Academy of Sciences, 620016, Yekaterinburg, Russia

    I. A. Weinstein

Authors
  1. A. O. Shilov
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  2. A. S. Vokhmintsev
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  3. A. M. A. Henaish
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  4. I. A. Weinstein
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Corresponding author

Correspondence to I. A. Weinstein.

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The authors declare that they have no conflicts of interest.

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Translated by M. Shmatikov

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Shilov, A.O., Vokhmintsev, A.S., Henaish, A.M. et al. Formation of the Intrinsic Absorption Edge in Nanostructured Hafnium Dioxide Powder. Bull. Russ. Acad. Sci. Phys. 86, 771–774 (2022). https://doi.org/10.3103/S1062873822070279

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  • DOI: https://doi.org/10.3103/S1062873822070279

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