Abstract
The variation in the composition, structure, and properties of CdTe films when bombarded with Ar+ ions in combination with annealing is investigated. It is established that the technological treatment makes CdTe film surfaces much smoother and the films become nearly perfect in their stoichiometric composition and properties.
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Belyaev, A.P., Rubets, V.P., Antipov, V.V., and Eremina, E.O., Semiconductors, 2010, vol. 44, p. 946.
Muzafarova, S.A., Mirsagatov, S h.A., and Janabergenov, J., Phys. Solid State, 2007, vol. 49, p. 1168.
Makhniy, V.P., Semiconductors, 2005, vol. 39, p. 792.
Tkachuk, P.N., Phys. Solid State, 2000, vol. 42, p. 2014.
Babentsov, V.N., Baidullaeva, A., Vlasenko, A.I., Gorban’, S.I., Dauletmuratov, B.K., and Mozol’, P.E., Fiz. Tekh. Poluprovodn. (S.-Peterburg), 1993, vol. 27, p. 1618.
Herndon, M.K., Gupta, A., Kaydanov, V.I., and Collins, R.T., Appl. Phys. Lett., 1999, vol. 75, p. 3503.
Umirzakov, B.E., Tashmukhamedova, D.A., Muradkabilov, D.M., and Boltaev, Kh.Kh., Tech. Phys., 2013, vol. 58, no. 6 p. 841.
Donaev, S.B., Djurabekova, F., Tashmukhamedova, D.A., and Umirzakov, B.E., Phys. Status Solidi C, 2015, vol. 12, p. 89.
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Original Russian Text © Y.S. Ergashov, D.A. Tashmukhamedova, F.G. Djurabekova, B.E. Umirzakov, 2016, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2016, Vol. 80, No. 2, pp. 157–159.
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Ergashov, Y.S., Tashmukhamedova, D.A., Djurabekova, F.G. et al. Effect of surface microroughness on the composition and electronic properties of CdTe/Mo(111) films. Bull. Russ. Acad. Sci. Phys. 80, 138–140 (2016). https://doi.org/10.3103/S1062873816020064
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DOI: https://doi.org/10.3103/S1062873816020064