Abstract
The evolution of the surface morphology of S87-2 lead silicate glass after annealing under different conditions has been studied by atomic force microscopy. It is established that annealed leads to the formation of two levels of surface roughness, with heights of about 5 and 120 nm (the first and second levels, respectively).
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Original Russian Text © S.K. Kulov, A.M. Karmokov, O.A. Molokanov, 2009, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2009, Vol. 73, No. 11, pp. 1649–1651.
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Kulov, S.K., Karmokov, A.M. & Molokanov, O.A. Nanoscale inhomogeneities on the microchannel plate lead silicate glass surface. Bull. Russ. Acad. Sci. Phys. 73, 1549–1551 (2009). https://doi.org/10.3103/S1062873809110318
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DOI: https://doi.org/10.3103/S1062873809110318