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Method for determining the depleted zone thickness in silicon charged particle detectors

  • Proceedings of the International Conference “Nucleus-2008” on the Fundamental Problems of Nuclear Physics and Development of Nuclear Physical Methods for Nanotechnologies, Medical Physics, and Atomic Power Engineering (LVIII International Conference on
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope


A method for determining the thickness of silicon charge particle detectors has been developed. The method is based on measurements of spectra from a standard 137Cs γ source, whose shape changes with detector thickness. The method can be used in the thickness range ∼50–6000 μm with an accuracy from 20 to 10%, respectively. No complex equipment or laborious calculations are needed.

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Correspondence to S. V. Artemov.

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Original Russian Text © S.V. Artemov, G.A. Radyuk, A.A. Karakhodzhaev, Ya.S. Abdullaeva, V.P. Yakushev, 2009, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2009, Vol. 73, No. 4, pp. 529–532.

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Artemov, S.V., Radyuk, G.A., Karakhodzhaev, A.A. et al. Method for determining the depleted zone thickness in silicon charged particle detectors. Bull. Russ. Acad. Sci. Phys. 73, 502–505 (2009).

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